[图书][B] Silicon nanophotonics: basic principles, present status, and perspectives

L Khriachtchev - 2016 - books.google.com
Photonics is a key technology of this century. The combination of photonics and silicon
technology is of great importance because of the potentiality of coupling electronics and …

Thin‐Layer Chemical Modulations by a Combined Selective Proton Pump and pH Probe for Direct Alkalinity Detection

MG Afshar, GA Crespo, E Bakker - Angewandte Chemie, 2015 - Wiley Online Library
We report a general concept based on a selective electrochemical ion pump used for
creating concentration perturbations in thin layer samples (∼ 40 μL). As a first example …

Quantitative analysis of doped/undoped ZnO nanomaterials using laser assisted atom probe tomography: Influence of the analysis parameters

N Amirifar, R Lardé, E Talbot, P Pareige… - Journal of Applied …, 2015 - pubs.aip.org
In the last decade, atom probe tomography has become a powerful tool to investigate
semiconductor and insulator nanomaterials in microelectronics, spintronics, and …

Size confinement of Si nanocrystals in multinanolayer structures

R Limpens, A Lesage, M Fujii, T Gregorkiewicz - Scientific Reports, 2015 - nature.com
Si nanocrystals (NCs) are often prepared by thermal annealing of multiple stacks of
alternating sub-stoichiometric SiO x and SiO2 nanolayers. It is frequently claimed that in …

Hydrodynamic coarsening in phase-separated silicate melts

D Bouttes, O Lambert, C Claireaux, W Woelffel… - Acta Materialia, 2015 - Elsevier
Using in situ synchrotron tomography, we investigate the coarsening dynamics of barium
borosilicate melts during phase separation. The 3-D geometry of the two interconnected …

Controlling photoluminescence of silicon quantum dots using pristine-nanostates formation

H Ahn, J Jeong, M Gu, YJ Chang, M Han - Optical Materials, 2024 - Elsevier
This study investigates the effective control of photoluminescence (PL) of silicon
nanocrystals (Si–NCs) embedded in a SiO 2 matrix, with a specific focus on tuning the …

Percolation threshold in annealed ultrathin SiO x films by 2D Monte Carlo simulations

A Sarikov, M Semenenko, S Shahan - CrystEngComm, 2024 - pubs.rsc.org
In this work, the kinetics of phase separation in ultrathin non-stoichiometric Si oxide (SiOx,
x< 2) films during high-temperature annealing is studied by Monte Carlo simulations on a …

Evolution of shape, size, and areal density of a single plane of Si nanocrystals embedded in SiO 2 matrix studied by atom probe tomography

B Han, Y Shimizu, G Seguini, E Arduca, C Castro… - RSC …, 2016 - pubs.rsc.org
Single planes of Si nanocrystals (NCs) embedded in a SiO2 matrix were synthesized by
annealing SiO2/SiO/SiO2 multilayer structures deposited on Si (100) substrates by e-beam …

[HTML][HTML] Nanoscale phase separation in epitaxial Cr-Mo and Cr-V alloy thin films studied using atom probe tomography: Comparison of experiments and simulation

A Devaraj, TC Kaspar, S Ramanan… - Journal of Applied …, 2014 - pubs.aip.org
Tailored metal alloy thin film-oxide interfaces generated using molecular beam epitaxy
(MBE) deposition of alloy thin films on a single crystalline oxide substrate can be used for …

Structural and optical study of Ce segregation in Ce-doped SiO1. 5 thin films

G Beainy, J Weimmerskirch-Aubatin, M Stoffel… - Journal of Applied …, 2015 - pubs.aip.org
Cerium doped SiO 1.5 thin films fabricated by evaporation and containing silicon
nanocrystals were investigated by atom probe tomography. The effect of post-growth …