[图书][B] SiC materials and devices

M Shur, SL Rumyantsev - 2006 - books.google.com
After many years of research and development, silicon carbide has emerged as one of the
most important wide band gap semiconductors. The first commercial SiC devices? power …

Heat generation in semiconductor devices

U Lindefelt - Journal of Applied Physics, 1994 - pubs.aip.org
A general and practical model for heat generation that can be used in the heat conduction
equation for nonisothermal semiconductor device simulations is presented. The model is …

Thermodynamic design of energy models of semiconductor devices

G Albinus, H Gajewski, R Hünlich - Nonlinearity, 2002 - iopscience.iop.org
In this paper a system of evolution equations for energy models of a semiconductor device is
derived in a deductive way from a generally accepted expression for the free energy. Only …

" Paradoxes" of carrier lifetime measurements in high-voltage SiC diodes

ME Levinshtein, TT Mnatsakanov… - … on Electron Devices, 2001 - ieeexplore.ieee.org
For Silicon Carbide (SiC) high-voltage rectifier diodes, contradictions appear when the most
important parameter of the diodes, the minority carrier lifetime, is measured by different …

[PDF][PDF] Мощные биполярные приборы на основе карбида кремния Обзор

ПА Иванов, МЕ Левинштейн… - Физика и техника …, 2005 - journals.ioffe.ru
В настоящее время освоение широкозонных материалов: карбида кремния SiC и
нитридов III-й группы—становится одним из главных направлений развития …

Power bipolar devices based on silicon carbide

PA Ivanov, ME Levinshtein, TT Mnatsakanov… - Semiconductors, 2005 - Springer
High-voltage 4 H-SiC bipolar devices, including rectifier diodes, bipolar junction transistors,
and thyristors are discussed. The results of experimental and theoretical studies of the …

Fabry-Perot lasers: Thermodynamics-based modeling

U Bandelow, H Gajewski, R Hünlich - Optoelectronic devices: Advanced …, 2005 - Springer
This chapter describes the modeling and the simulation of edgeemitting quantum well (QW)
lasers, based on the drift-diffusion equations and equations for the optical field. By applying …

Analytical and numerical studies of p+-emitters in silicon carbide bipolar devices

ME Levinshtein, TT Mnatsakanov… - Semiconductor …, 2011 - iopscience.iop.org
In this paper, ways to create silicon carbide p+-emitters with high injection coefficients are
considered. Raising the emitter doping level, eliminating the deteriorated layer, and making …

Minority carrier injection and current–voltage characteristics of Schottky diodes at high injection level

TT Mnatsakanov, ME Levinshtein, AG Tandoev… - Solid-state …, 2016 - Elsevier
Transport phenomena in Schottky diodes are analyzed at high injection levels of minority
carriers. It is shown that the correct description of these phenomena requires that the mode …

Parameters of electron–hole scattering in silicon carbide

TT Mnatsakanov, ME Levinshtein, PA Ivanov… - Journal of applied …, 2003 - pubs.aip.org
The parameters of electron–hole scattering EHS in silicon carbide SiC are estimated by
analyzing pulsed isothermal current–voltage characteristics of 6.0 kV 4H–SiC diodes over a …