[图书][B] Radiation effects in advanced semiconductor materials and devices

C Claeys, E Simoen - 2013 - books.google.com
In the modern semiconductor industry, there is a growing need to understand and combat
potential radiation damage problems. Space applications are an obvious case, but, beyond …

On the potential of SiGe HBTs for extreme environment electronics

JD Cressler - Proceedings of the IEEE, 2005 - ieeexplore.ieee.org
" Extreme environments" represents an important niche market for electronics and spans the
operation of electronic components in surroundings lying outside the domain of …

[图书][B] Silicon Heterostructure Handbook: Materials, Fabrication, Devices, Circuits and Applications of SiGe and Si Strained-Layer Epitaxy

JD Cressler, S Monfray, G Freeman, D Friedman… - 2018 - taylorfrancis.com
An extraordinary combination of material science, manufacturing processes, and innovative
thinking spurred the development of SiGe heterojunction devices that offer a wide array of …

Radiation effects in SiGe technology

JD Cressler - IEEE transactions on Nuclear Science, 2013 - ieeexplore.ieee.org
Silicon-Germanium (SiGe) technology effectively merges the desirable attributes of
conventional silicon-based CMOS manufacturing (high integration levels, at high yield and …

Single event effects in circuit-hardened SiGe HBT logic at gigabit per second data rates

PW Marshall, MA Carts, A Campbell… - … on Nuclear Science, 2000 - ieeexplore.ieee.org
This attempt at circuit level single event effects (SEE) hardening of SiGe HBT logic provides
the first reported indication of the level of sensitivity in this important technology …

Emerging SiGe HBT reliability issues for mixed-signal circuit applications

JD Cressler - IEEE Transactions on Device and Materials …, 2004 - ieeexplore.ieee.org
We review the emerging reliability issues associated with high-performance SiGe HBT
technologies which are being increasingly deployed in a wide variety of mixed-signal circuit …

From displacement damage to ELDRS: Fifty years of bipolar transistor radiation effects at the NSREC

KF Galloway, RL Pease, RD Schrimpf… - IEEE Transactions on …, 2013 - ieeexplore.ieee.org
The fifty year history of radiation effects in bipolar transistors at NSREC is summarized,
covering neutron-induced displacement damage, total ionizing dose response (including …

Impact of Bias Conditions on Total Ionizing Dose Effects of in SiGe HBT

J Zhang, Q Guo, H Guo, W Lu, C He… - … on Nuclear Science, 2016 - ieeexplore.ieee.org
The effect of bias condition on total ionizing dose (TID) of Silicon–Germanium heterojunction
bipolar transistors (SiGe HBTs) is investigated. The SiGe HBTs are set at forward, saturated …

A comparison of gamma and proton radiation effects in 200 GHz SiGe HBTs

AK Sutton, BM Haugerud, APG Prakash… - … on Nuclear Science, 2005 - ieeexplore.ieee.org
We present the results of gamma irradiation on third-generation, 200 GHz SiGe HBTs. Pre-
and post-radiation dc figures-of-merit are used to quantify the tolerance of the raised …

Proton radiation response of SiGe HBT analog and RF circuits and passives

JD Cressler, MC Hamilton, R Krithivasan… - … on Nuclear Science, 2001 - ieeexplore.ieee.org
Presents the first experimental results of the effects of 63 MeV proton irradiation on SiGe
heterojunction bipolar transistor (HBT) analog and radio-frequency (RF) circuits and passive …