Deep traps in GaN-based structures as affecting the performance of GaN devices

AY Polyakov, IH Lee - Materials Science and Engineering: R: Reports, 2015 - Elsevier
New developments in theoretical studies of defects and impurities in III-Nitrides as pertinent
to compensation and recombination in these materials are discussed. New results on …

Overview of band-edge and defect related luminescence in aluminum nitride

T Koppe, H Hofsäss, U Vetter - Journal of Luminescence, 2016 - Elsevier
This review gives the reader an overview of the published results describing near band-
edge as well as defect related luminescence in aluminum nitride, also presenting findings …

A first-principles understanding of point defects and impurities in GaN

JL Lyons, D Wickramaratne… - Journal of Applied …, 2021 - pubs.aip.org
Attaining control over the electrical conductivity of gallium nitride through impurity doping is
one of the foremost achievements in semiconductor science. Yet, unwanted contaminants …

Dysprosium-doped cadmium oxide as a gateway material for mid-infrared plasmonics

E Sachet, CT Shelton, JS Harris, BE Gaddy, DL Irving… - Nature materials, 2015 - nature.com
The interest in plasmonic technologies surrounds many emergent optoelectronic
applications, such as plasmon lasers, transistors, sensors and information storage. Although …

Origins of optical absorption and emission lines in AlN

Q Yan, A Janotti, M Scheffler… - Applied Physics …, 2014 - pubs.aip.org
To aid the development of AlN-based optoelectronics, it is essential to identify the defects
that cause unwanted light absorption and to minimize their impact. Using hybrid functional …

[HTML][HTML] On compensation in Si-doped AlN

JS Harris, JN Baker, BE Gaddy, I Bryan, Z Bryan… - Applied Physics …, 2018 - pubs.aip.org
Controllable n-type doping over wide ranges of carrier concentrations in AlN, or Al-rich
AlGaN, is critical to realizing next-generation applications in high-power electronics and …

Origination and evolution of point defects in AlN film annealed at high temperature

C Kai, H Zang, J Ben, K Jiang, Z Shi, Y Jia, X Cao… - Journal of …, 2021 - Elsevier
While high temperature annealing has been proven to be an effective strategy to reduce
threading dislocation density of AlN film, the point defect induced near-ultraviolet emission …

KOH based selective wet chemical etching of AlN, AlxGa1− xN, and GaN crystals: A way towards substrate removal in deep ultraviolet-light emitting diode

W Guo, R Kirste, I Bryan, Z Bryan, L Hussey… - Applied Physics …, 2015 - pubs.aip.org
A controllable and smooth potassium hydroxide-based wet etching technique was
developed for the AlGaN system. High selectivity between AlN and AlxGa1ÀxN (up to 12Â) …

Thermal conductivity of single-crystalline AlN

R Rounds, B Sarkar, A Klump, C Hartmann… - Applied Physics …, 2018 - iopscience.iop.org
The thermal conductivity of AlN single crystals grown by physical vapor transport (PVT) and
hydride vapor phase epitaxy (HVPE) was measured in the range of 30 to 325 K by the 3ω …

Tracking of point defects in the full compositional range of AlGaN via photoluminescence spectroscopy

J Hyun Kim, P Bagheri, R Kirste, P Reddy… - … status solidi (a), 2023 - Wiley Online Library
A comprehensive energy map as a function of AlGaN composition over the whole alloy
range is presented for commonly observed point defects in nominally intrinsic, n‐, and p …