Today more than ever before, academia, manufacturers, and hyperscalers acknowledge the major challenge of silent data corruptions (SDCs) and aim on solutions to minimize its …
Microprocessor power consumption and dependability are both crucial challenges that designers have to cope with due to shrinking feature sizes and increasing transistor counts …
A Singh, S Chakravarty, G Papadimitriou… - 2023 IEEE 41st VLSI …, 2023 - ieeexplore.ieee.org
Chip manufacturers and hyperscalers are becoming increasingly aware of the problem posed by Silent Data Errors (SDE) and are taking steps to address it. Major computing …
Miniaturization of integrated circuits brings more devices (thus more functionality) on the same silicon area but also makes them more vulnerable to soft (transient) errors …
In this paper, we present gem5-MARVEL, the first consolidated microarchitecture-level fault injection infrastructure for heterogeneous System-on-Chip architectures comprising CPUs of …
Silent Data Corruptions (SDCs) pose a significant threat to the integrity of digital systems. These stealthy saboteurs silently corrupt data, remaining undetected by traditional error …
In this paper, we present a fine-grained characterization of the impact of transient faults (soft errors) on program execution for different compiler optimization levels and two out-of-order …
N Karystinos, O Chatzopoulos… - 2024 ACM/IEEE 51st …, 2024 - ieeexplore.ieee.org
Several hyperscalers have recently disclosed the occurrence of Silent Data Corruptions (SDCs) in their systems fleets, sparking concerns about the severity of known and the …
Silent data corruptions (SDCs) pose a significant challenge to the reliable operation of modern microprocessors. As the need for enhanced performance and reliability continues to …