Imaging beyond the surface region: Probing hidden materials via atomic force microscopy

A Farokh Payam, A Passian - Science Advances, 2023 - science.org
Probing material properties at surfaces down to the single-particle scale of atoms and
molecules has been achieved, but high-resolution subsurface imaging remains a …

Advanced atomic force microscopies and their applications in two-dimensional materials: a review

R Xu, J Guo, S Mi, H Wen, F Pang, W Ji… - Materials …, 2022 - iopscience.iop.org
Scanning probe microscopy (SPM) allows the spatial imaging, measurement, and
manipulation of nano and atomic scale surfaces in real space. In the last two decades …

Glass-ceramics for nuclear-waste immobilization

JS McCloy, A Goel - Mrs Bulletin, 2017 - cambridge.org
Crystallization in glasses is usually considered to be a problem in the glass industry.
However, controlled crystallization of glasses is an important prerequisite in the …

Probing the nature of charge carriers in one-dimensional conjugated polymers: a review of the theoretical models, experimental trends, and thermoelectric …

Y Liu, S Gao, X Zhang, JH Xin, C Zhang - Journal of Materials …, 2023 - pubs.rsc.org
Since the first discovery of polyacetylene in the late 1970s, one-dimensional (1D)
conjugated polymers have attracted immense research interest as a result of their high …

Dominant factors and their action mechanisms on material removal rate in electrochemical mechanical polishing of 4H-SiC (0001) surface

X Yang, X Yang, K Kawai, K Arima, K Yamamura - Applied Surface Science, 2021 - Elsevier
Slurryless electrochemical mechanical polishing (ECMP) has been confirmed as a highly
efficient damage-free polishing technique for SiC wafers. To increase the material removal …

Nondestructive imaging of atomically thin nanostructures buried in silicon

G Gramse, A Kölker, T Lim, TJZ Stock, H Solanki… - Science …, 2017 - science.org
It is now possible to create atomically thin regions of dopant atoms in silicon patterned with
lateral dimensions ranging from the atomic scale (angstroms) to micrometers. These …

Local electrical characterization of two-dimensional materials with functional atomic force microscopy

S Hussain, K Xu, S Ye, L Lei, X Liu, R Xu, L Xie… - Frontiers of …, 2019 - Springer
Research about two-dimensional (2D) materials is growing exponentially across various
scientific and engineering disciplines due to the wealth of unusual physical phenomena that …

Microwave microscopy and its applications

Z Chu, L Zheng, K Lai - Annual Review of Materials Research, 2020 - annualreviews.org
Understanding the nanoscale electrodynamic properties of a material at microwave
frequencies is of great interest for materials science, condensed matter physics, device …

[HTML][HTML] Inverted scanning microwave microscope for in vitro imaging and characterization of biological cells

M Farina, X Jin, G Fabi, E Pavoni, A Di Donato… - Applied Physics …, 2019 - pubs.aip.org
This paper presents an instrument called an inverted scanning microwave microscope
(iSMM), which is capable of performing noninvasive and label-free imaging and …

Nanoscale Probing of Electrical Memory Effects in van der Waals Layered PdSe2

SM Neumayer, O Olunloyo… - ACS Applied Materials …, 2024 - ACS Publications
Tunable electronic materials that can be switched between different impedance states are
fundamental to the hardware elements for neuromorphic computing architectures. This …