A brief review of selected aspects of the materials science of ball bonding

CD Breach, FW Wulff - Microelectronics Reliability, 2010 - Elsevier
Thermosonic ball bonding is a metallurgical process that until recently was rarely the subject
of metallurgical analysis. However, in recent years greater focus has been given to the …

Evolutions of bonding wires used in semiconductor electronics: perspective over 25 years

CL Gan, U Hashim - Journal of Materials Science: Materials in Electronics, 2015 - Springer
The objective of this review is to study the evolution and key findings and critical technical
challenges, solutions and future trend of bonding wires used in semiconductor electronics …

Growth behavior of Cu/Al intermetallic compounds and cracks in copper ball bonds during isothermal aging

CJ Hang, CQ Wang, M Mayer, YH Tian, Y Zhou… - Microelectronics …, 2008 - Elsevier
Copper wires are increasingly used in place of gold wires for making bonded
interconnections in microelectronics. There are many potential benefits for use of copper in …

[图书][B] Copper wire bonding

PS Chauhan, A Choubey, ZW Zhong, MG Pecht… - 2014 - Springer
Chapter 1 gives an introduction to Cu wire bonding technology. The advantages of Cu over
Au, such as lower cost, higher mechanical strength, and higher electrical and thermal …

Corrosion study at Cu–Al interface in microelectronics packaging

CW Tan, AR Daud, MA Yarmo - Applied Surface Science, 2002 - Elsevier
The interfacial shear (IS) force of copper ball onto aluminium-based bond pad in
microelectronics packaging depends on the formation and growth of Cu–Al intermetallic …

Corrosion study and intermetallics formation in gold and copper wire bonding in microelectronics packaging

CS Goh, WLE Chong, TK Lee, C Breach - Crystals, 2013 - mdpi.com
A comparison study on the reliability of gold (Au) and copper (Cu) wire bonding is conducted
to determine their corrosion and oxidation behavior in different environmental conditions …

Characterisation of intermetallic growth in copper and gold ball bonds on aluminium metallization

FW Wulff, CD Breach, D Stephan… - Proceedings of 6th …, 2004 - ieeexplore.ieee.org
While the characterisation of intermetallic coverage and intermetallic phase (IP) growth in
gold ball bonding on aluminium is quite well understood, there is relatively little literature …

A re-examination of the mechanism of thermosonic copper ball bonding on aluminium metallization pads

H Xu, C Liu, VV Silberschmidt, SS Pramana, TJ White… - Scripta Materialia, 2009 - Elsevier
The nanoscale interfacial characteristics of thermosonic copper ball bonding on aluminium
metallization were investigated. It was found that ultrasonic vibration swept oxides of …

Reliability evaluation of multichip phase-leg IGBT modules using pressureless sintering of nanosilver paste by power cycling tests

S Fu, Y Mei, X Li, C Ma, GQ Lu - IEEE Transactions on Power …, 2016 - ieeexplore.ieee.org
Nanosilver paste has become a promising lead-free die-attach material for power electronic
packaging. This development solves the challenges faced by power device manufacturers to …

Investigation of growth behavior of Al–Cu intermetallic compounds in Cu wire bonding

J Chen, YS Lai, YW Wang, CR Kao - Microelectronics reliability, 2011 - Elsevier
In this work, we investigate the intermetallic compound formation in Cu wire bonded device.
Voids near the Cu side at the bond interface are clearly seen. Nevertheless, these voids do …