Wide bandgap devices in AC electric drives: Opportunities and challenges

AK Morya, MC Gardner, B Anvari, L Liu… - IEEE Transactions …, 2019 - ieeexplore.ieee.org
Wide bandgap (WBG) device-based power electronics converters are more efficient and
lightweight than silicon-based converters. WBG devices are an enabling technology for …

Review and analysis of SiC MOSFETs' ruggedness and reliability

J Wang, X Jiang - IET Power Electronics, 2020 - Wiley Online Library
SiC MOSFETs (silicon carbide metal‐oxide semiconductor field‐effect transistors) are
replacing Si insulated gate bipolar transistors in many power conversion applications due to …

Review on SiC MOSFETs high-voltage device reliability focusing on threshold voltage instability

K Puschkarsky, T Grasser, T Aichinger… - … on Electron Devices, 2019 - ieeexplore.ieee.org
An overview over issues and findings in SiC power MOSFET reliability is given. The focus of
this article is on threshold instabilities and the differences to Si power MOSFETs …

A comprehensive study of short-circuit ruggedness of silicon carbide power MOSFETs

G Romano, A Fayyaz, M Riccio… - IEEE Journal of …, 2016 - ieeexplore.ieee.org
The behavior of silicon carbide (SiC) power MOSFETs under stressful short-circuit (SC)
conditions is investigated in this paper. Two different SC failure phenomena for SiC power …

Short-circuit protection circuits for silicon-carbide power transistors

DP Sadik, J Colmenares, G Tolstoy… - IEEE transactions on …, 2015 - ieeexplore.ieee.org
An experimental analysis of the behavior under short-circuit conditions of three different
silicon-carbide (SiC) 1200-V power devices is presented. It is found that all devices take up …

Comparison and discussion on shortcircuit protections for silicon-carbide MOSFET modules: Desaturation versus Rogowski switch-current sensor

S Mocevic, J Wang, R Burgos… - IEEE Transactions …, 2020 - ieeexplore.ieee.org
Survivability of silicon-carbide (SiC) mosfet modules during short circuit (SC) is essential for
modern power electronics systems due to large economic implications. SiC mosfet modules …

SiC power MOSFETs performance, robustness and technology maturity

A Castellazzi, A Fayyaz, G Romano, L Yang… - Microelectronics …, 2016 - Elsevier
Abstract Relatively recently, SiC power MOSFETs have transitioned from being a research
exercise to becoming an industrial reality. The potential benefits that can be drawn from this …

Accurate Temperature Estimation of SiC Power mosfets Under Extreme Operating Conditions

A Tsibizov, I Kovačević-Badstübner… - … on Power Electronics, 2019 - ieeexplore.ieee.org
Electrothermal modeling of silicon carbide (SiC) power devices is frequently performed to
estimate the device temperature in operation, typically assuming a constant thermal …

Short-circuit failure mechanism of SiC power MOSFETs

G Romano, L Maresca, M Riccio… - 2015 IEEE 27th …, 2015 - ieeexplore.ieee.org
Failure mechanisms during short-circuit conditions of Silicon Carbide Power MOSFETs are
analysed in this work, and a possible theoretical explanation is provided. Insight into the …

A temperature-dependent SPICE model of SiC power MOSFETs for within and out-of-SOA simulations

M Riccio, V d'Alessandro, G Romano… - … on power electronics, 2017 - ieeexplore.ieee.org
This paper presents a temperature-dependent SPICE model for SiC power MOSFETs. The
model describes the static and dynamic behavior and accounts for leakage current and …