J Wang, X Jiang - IET Power Electronics, 2020 - Wiley Online Library
SiC MOSFETs (silicon carbide metal‐oxide semiconductor field‐effect transistors) are replacing Si insulated gate bipolar transistors in many power conversion applications due to …
An overview over issues and findings in SiC power MOSFET reliability is given. The focus of this article is on threshold instabilities and the differences to Si power MOSFETs …
The behavior of silicon carbide (SiC) power MOSFETs under stressful short-circuit (SC) conditions is investigated in this paper. Two different SC failure phenomena for SiC power …
An experimental analysis of the behavior under short-circuit conditions of three different silicon-carbide (SiC) 1200-V power devices is presented. It is found that all devices take up …
Survivability of silicon-carbide (SiC) mosfet modules during short circuit (SC) is essential for modern power electronics systems due to large economic implications. SiC mosfet modules …
A Castellazzi, A Fayyaz, G Romano, L Yang… - Microelectronics …, 2016 - Elsevier
Abstract Relatively recently, SiC power MOSFETs have transitioned from being a research exercise to becoming an industrial reality. The potential benefits that can be drawn from this …
A Tsibizov, I Kovačević-Badstübner… - … on Power Electronics, 2019 - ieeexplore.ieee.org
Electrothermal modeling of silicon carbide (SiC) power devices is frequently performed to estimate the device temperature in operation, typically assuming a constant thermal …
Failure mechanisms during short-circuit conditions of Silicon Carbide Power MOSFETs are analysed in this work, and a possible theoretical explanation is provided. Insight into the …
This paper presents a temperature-dependent SPICE model for SiC power MOSFETs. The model describes the static and dynamic behavior and accounts for leakage current and …