Diagnosis is essential in modern chip production to increase yield, and debug constitutes a
major part in the pre-silicon development process. For recent process technologies, defect …

Nanoelectronics is changing the way the world communicates, and is transforming our daily
lives. Continuing Moore's law and miniaturization of low-power semiconductor chips with …

A novel statistical learning algorithm is proposed to accurately analyze volume diagnosis
results. This algorithm effectively overcomes the inherent ambiguities in logic diagnosis, to …

An efficient parallel algorithm for testing whether a graph G is k-vertex connected is
presented. The algorithm runs in O(k^2\logn) time and uses (n+k^2)kC(n,m) processors on a …

In this paper we present practical techniques that enable diagnosis of defective library cells
in a failing die. Our technique can handle large industrial designs and practical situations …

With test quality being an imperative, this paper presents a methodology on how to apply
volume scan diagnosis-known from the field of yield learning-to the domain of test quality …

In systems consisting of multiple clusters of processors which are interconnected by
relatively slow communication links and which employ space sharing for scheduling jobs …

The industry is encountering an increasing number of front-end-of-line defects in the most
advanced technology nodes due to extremely small feature size and complex manufacturing …

With decreasing feature sizes and increasing complexity of fabrication processes for
manufacturing VLSI semiconductor devices, more systematic defects occur at the advanced …

In distributed memory multicomputers, local memory accesses are much faster than those
involving interprocessor communication. For the sake of reducing or even eliminating the …