Validation of IC conducted emission and immunity models including aging and thermal stress

QM Khan, M Koohestani, JL Levant… - IEEE Transactions …, 2023 - ieeexplore.ieee.org
Environmental factors, such as aging and thermal stress, can seriously impact the
electromagnetic compatibility behavior of an integrated circuit (IC). The standardized IC …

Modeling Nonlinear Black-Box Conducted Immunity of Mixed Analog-Digital Integrated Circuits Using Particle Swarm Optimization (PSO) and Piecewise Volterra …

X Chen, S Xie, M Wei, B Shao, Y Li… - IEEE Transactions …, 2024 - ieeexplore.ieee.org
This article addresses the challenge of modeling the conducted immunity of mixed analog-
digital integrated Circuits under electromagnetic interference (EMI). We propose a black-box …

Conduction immunity modeling approach for nonlinear IB module based on multi-harmonic distortion theory in analog-digital integrated circuit (MADIC)

X Chen, S Xie, M Wei - IEICE Electronics Express, 2024 - jstage.jst.go.jp
The existing chip RF conduction immunity modeling method, integrated circuit immunity
model conducted immunity (ICIM-CI), in mixed analog-digital integrated circuit (MADIC) is …