Double barrier nature of Au/p-GaTe Schottky contact: Linearization of Richardson plot

M Gülnahar, H Efeoğlu - Solid-state electronics, 2009 - Elsevier
The current–voltage (I–V) characteristics of Au/p-GaTe Schottky contact were characterized
at 60–300K temperature range and compared with those of Al/p-GaTe. The observed …

Bi-doped GaTe single crystals: Growth and thermoelectric properties

TH Vu, AT Pham, JH Park, SD Park, S Cho - Journal of Solid State …, 2021 - Elsevier
Here bismuth (Bi) was utilized to substitute Te sites to increase the hole concentration,
thereby enhancing the thermoelectric performance of GaTe. Bi-doped GaTe single crystals …

Current-and capacitance-voltage characteristics of Cd/p-GaTe Schottky barrier diodes under hydrostatic pressure

G Çankaya, B Abay - Semiconductor science and technology, 2005 - iopscience.iop.org
Schottky barrier diodes (SBDs) on p-type GaTe have been fabricated by Cd metallization
and characterized by current–voltage (I–V) and capacitance–voltage (C–V) techniques as a …

On the studies of capacitance-voltage-temperature and deep level characteristics of an Au/p-GaTe Schottky diode

M Gülnahar, H Efeoğlu, M Şahin - Journal of Alloys and Compounds, 2017 - Elsevier
This paper deals with the capacitive properties of an unintentionally doped Au/p-GaTe/In
Schottky junction. The capacitance-voltage (CV) measurements are realized at 120–300 K …

Theoretical studies of defect states in GaTe

Z Rak, SD Mahanti, KC Mandal… - Journal of Physics …, 2008 - iopscience.iop.org
Using first principle electronic structure calculations within density functional theory and the
supercell model, we have investigated the nature and formation energies of defect states …

Multiple-barrier distribution behavior of Mo/p-GaTe fabricated with sputtering

M Gülnahar, H Efeoğlu - Journal of alloys and compounds, 2011 - Elsevier
A Molybdenum Schottky diode on unintentially doped p-GaTe was fabricated using DC
sputtering. I–V characteristics of the fabricated diode were measured as a function of …

Measurement and modelling of the characteristic parameters for silver Schottky contacts on layered p-GaSe compound in a wide temperature range

B Abay - Journal of alloys and compounds, 2010 - Elsevier
The temperature dependent barrier characteristics of Ag/p-GaSe Schottky barrier diodes
have been analyzed in the temperature range of 70–350K based on thermionic emission …

Fabrication and electrical characterisation of the Ti/GaTe/p-Si device under 18 MeV electron irradiation

K Çinar, Ş Aydoğan, C Coşkun - Journal of Radioanalytical and Nuclear …, 2014 - Springer
We deposited GaTe thin films with electrochemical growth technique on p-Si (100) substrate
and investigated their structural and electrical properties. The electrical characteristics of the …

Thermal creation of defects in GaTe

A Zubiaga, JA Garcia, F Plazaola… - Japanese journal of …, 2008 - iopscience.iop.org
Photoluminescence spectra of as-grown and annealed GaTe single crystals in the 0.7–1.8
eV range have been analyzed at different temperatures. Annealing up to 200 C produces an …

Effect of Annealing on Structure and Optical Properties of GaTe Thin Films

MM El-Nahass, MH Ali - journals.ekb.eg
GaTe thin films were deposited by thermal evaporation technique. The effect of annealing on
the structure and optical properties was studied. X-ray diffraction of the as deposited films …