It is little more than 15-years since the idea of Iddq testing was first proposed. Many
semiconductor companies now consider Iddq testing as an integral part of the overall testing …

The increasing volume of unsolicited bulk e-mail (also known as spam) has generated a
need for reliable antispam filters. Using a classifier based on machine learning techniques …

This paper presents a new built-in current sensor (BICS)-based I_\rmDDQ testing scheme
for complementary metal-oxide semiconductor (CMOS) integrated circuits (ICs). The …

The observation of spectral components of the power dissipated by devices and circuits in
integrated circuits (IC) by temperature measurements is limited by the bandwidth of either …

A technique integrating the oscillation, power supply current and I/sub DDQ/based testing of
circuit under test (CUT) is presented. A CMOS operational amplifier with floating gate input …

This work presents a case study, which attempts to improve the fault diagnosis and testability
of the oscillation testing methodology applied to a typical two-stage CMOS operational …

The paper describes the design for testability (DFT) of low voltage two stage operational
transconductance amplifiers based on quiescent power supply current (IDDQ) testing. IDDQ …

In this work experimental results on a built-in current sensor for dynamic current testing, i (t),
based on integration concepts are presented. The experimental validation proposed in this …

In this work, a new IDDQ built-in self-test (BIST) solution is proposed to provide accurate on-
chip current measurements for phase-locked loops (PLLs) found in deep-submicron system …

We present design, implementation and test of a built-in current sensor for Delta-I DDQ
testing of a CMOS 12-bit charge scaling digital-to-analog converter (DAC). The sensor uses …