Comprehensive topological overview of rolling stock architectures and recent trends in electric railway traction systems

D Ronanki, SA Singh… - IEEE Transactions on …, 2017 - ieeexplore.ieee.org
This paper reviews the modern electric propulsion architectures and configurations for
railway traction, which are currently in practice. The development and advancement of …

Balancing of peak currents between paralleled SiC MOSFETs by drive-source resistors and coupled power-source inductors

Y Mao, Z Miao, CM Wang… - IEEE Transactions on …, 2017 - ieeexplore.ieee.org
The peak currents between two paralleled SiC MOSFETs could differ significantly due to the
mismatch in threshold voltages V th. The method described herein employs passive …

A current-dependent switching strategy for Si/SiC hybrid switch-based power converters

J He, R Katebi, N Weise - IEEE Transactions on Industrial …, 2017 - ieeexplore.ieee.org
Hybrid switches configured by paralleling Silicon (Si) Insulated Gate Bipolar Transistors
(IGBT) and Silicon Carbide (SiC) Metal-Oxide Semiconductor Field-Effect Transistors …

A double-end sourced wire-bonded multichip SiC MOSFET power module with improved dynamic current sharing

M Wang, F Luo, L Xu - IEEE Journal of Emerging and Selected …, 2017 - ieeexplore.ieee.org
This paper proposes a double-end sourced layout for multichip SiC MOSFET power module
adopting conventional wire-bonded packaging technology. The unique design provides …

Chips classification for suppressing transient current imbalance of parallel-connected silicon carbide MOSFETs

J Ke, Z Zhao, P Sun, H Huang… - IEEE Transactions on …, 2019 - ieeexplore.ieee.org
This article addresses the influence of parameters spread on transient current distribution
among parallel-connected silicon carbide (SiC) mosfets and proposes a chips classification …

Statistical analysis of the electrothermal imbalances of mismatched parallel SiC power MOSFETs

A Borghese, M Riccio, A Fayyaz… - IEEE Journal of …, 2019 - ieeexplore.ieee.org
Thanks to the increasing availability of silicon carbide (SiC) metal oxide semiconductor field
effect transistors (MOSFETs) with outstanding static and dynamic performances, the number …

Influences of circuit mismatch on paralleling silicon carbide MOSFETs

Q Haihong, Z Ying, Z Ziyue, W Dan… - 2017 12th IEEE …, 2017 - ieeexplore.ieee.org
Current sharing is a major problem for paralleling devices, which can affect the performance
and reliability of devices. In this paper, the factors leading to current unbalance in paralleling …

Influence of device parameters spread on current distribution of paralleled silicon carbide MOSFETs

J Ke, Z Zhao, P Sun, H Huang, J Abuogo… - Journal of power …, 2019 - koreascience.kr
This paper systematically investigates the influence of device parameters spread on the
current distribution of paralleled silicon carbide (SiC) MOSFETs. First, a variation coefficient …

Accurate modeling of the effective parasitic parameters for the laminated busbar connected with paralleled SiC MOSFETs

J Wang, S Yu, X Zhang, Z Wei, N Jiang… - … on Circuits and …, 2021 - ieeexplore.ieee.org
Silicon Carbide (SiC) MOSFETs are usually paralleled to increase the current capability for
high power applications. While, the asymmetrical parasitic parameters of the wide-used …

Current sharing and overvoltage issues of paralleled SiC MOSFET modules

K Mainali, J Sabate, S Klopman - 2019 IEEE energy …, 2019 - ieeexplore.ieee.org
The development of the medium voltage wideband gap semiconductor SiC power devices
has enabled several applications. Most of these medium voltage high power applications …