Reducing wasted resources to help achieve green data centers

J Torres, D Carrera, K Hogan… - … on Parallel and …, 2008 - ieeexplore.ieee.org
In this paper we introduce a new approach to the consolidation strategy of a data center that
allows an important reduction in the amount of active nodes required to process a …

Design automation of real-life asynchronous devices and systems

A Taubin, J Cortadella, L Lavagno… - … and Trends® in …, 2007 - nowpublishers.com
The number of gates on a chip is quickly growing toward and beyond the one billion mark.
Keeping all the gates running at the beat of a single or a few rationally related clocks is …

Characterization of asynchronous templates for integration into clocked CAD flows

KS Stevens, Y Xu, V Vij - 2009 15th IEEE Symposium on …, 2009 - ieeexplore.ieee.org
Asynchronous circuit design can result in substantial benefits of reduced power, improved
performance, and high modularity. However, asynchronous design styles are largely …

Automatic scan insertion and test generation for asynchronous circuits

FT Beest, A Peeters, M Verra… - Proceedings …, 2002 - ieeexplore.ieee.org
A test method for asynchronous handshake circuits is presented that is based on
synchronous full-scan techniques. The method adds a synchronous test mode to the circuit …

Adding synchronous and LSSD modes to asynchronous circuits

K van Berkel, A Peeters, F te Beest - Microprocessors and Microsystems, 2003 - Elsevier
A synchronous mode as well as a scan mode of operation are added to a large class of
asynchronous circuits, in compliance with LSSD design rules. This enables the application …

A multiplexer based test method for self-timed circuits

F te Beest, A Peeters - 11th IEEE International Symposium on …, 2005 - ieeexplore.ieee.org
A new test method for self-timed circuits is presented that only uses multiplexers to make the
majority of combinational feedback loops testable. Combinational feedback loops are …

Test pattern generation and partial-scan methodology for an asynchronous SoC interconnect

A Efthymiou, J Bainbridge… - IEEE Transactions on …, 2005 - ieeexplore.ieee.org
Asynchronous design offers a solution to the interconnect problems faced by system-on-chip
(SoC) designers, but their adoption has been held back by a lack of methodology and …

Verification and Validation with Prototype Chip Implemented with Layout Level Scan C-Elements

H Iwata, K Yamasaki, K Yamaguchi - Journal of Electronic Testing, 2024 - Springer
Establishing a general and high-quality testing method for fabricated asynchronous circuits
is crucial for the widespread adoption of asynchronous circuits. A full scan design for …

Bipartite full scan design: A dft method for asynchronous circuits

H Iwata, S Ohtake, M Inoue… - 2010 19th IEEE Asian …, 2010 - ieeexplore.ieee.org
A globally-asynchronous and locally-synchronous (GALS) system has been known as a
realistic hardware design solution for many difficulties such as global clock network that …

Design of a test processor for asynchronous chip test

S Zeidler, C Wolf, M Krstic, F Vater… - 2011 Asian Test …, 2011 - ieeexplore.ieee.org
Due to asynchronous timing and arbitration asynchronous designs may behave no
deterministically. For the test of such systems, this means that an exact timing, ie a tester …