The past two decades have seen atomic force microscopy (AFM) evolve from an
experimental technique to probe simple surface topography to one that can spatially map …

Downscaling, miniaturization and 3D staking of the micro/nano devices are burgeoning
phenomena in the semiconductor industry which have posed sophisticated challenges in …

Abstract Atomic Force Microscopy (AFM) is a widely employed tool for micro-and nanoscale
topographic imaging. However, conventional AFM scanning struggles to reconstruct …

Quantitative determination of the geometry of an atomic force microscope (AFM) probe tip is
critical for robust measurements of the nanoscale properties of surfaces, including accurate …

Observing the structural dynamics of biomolecules is vital to deepening our understanding
of biomolecular functions. High-speed (HS) atomic force microscopy (AFM) is a powerful …

Abstract International comparisons between National Metrology Institutes are important to
verify measurement results and the associated uncertainties. In this paper, we report a …

Wear phenomenon impact the operating efficiency and service life of engineering materials
due to the influence of surface interaction at different working conditions. Successive …

Based on the interaction between the extremely sharp tip and the sample, atomic force
microscopy (AFM) has been widely utilized to explore the surface phenomena at the nano …

Surface topography, or height profile, is a critical property for various micro-and
nanostructured materials and devices, as well as biological systems. At the nanoscale …

It has become increasingly common to use atomic force microscopy measurements to probe
mechanical properties at the nano-micro level. The data obtained from these measurements …