[图书][B] Breakdown phenomena in semiconductors and semiconductor devices

ME Levinshtein, J Kostamovaara, S Vainshtein - 2005 - books.google.com
Impact ionization, avalanche and breakdown phenomena form the basis of many very
interesting and important semiconductor devices, such as avalanche photodiodes …

Analytical and numerical studies of p+-emitters in silicon carbide bipolar devices

ME Levinshtein, TT Mnatsakanov… - Semiconductor …, 2011 - iopscience.iop.org
In this paper, ways to create silicon carbide p+-emitters with high injection coefficients are
considered. Raising the emitter doping level, eliminating the deteriorated layer, and making …

Carrier diffusion characterization in epitaxial 4H–SiC

P Grivickas, J Linnros, V Grivickas - Journal of Materials Research, 2001 - cambridge.org
Carrier diffusivity has been experimentally determined in low-doped n-type epitaxial 4H–SiC
over a wide injection range using a Fourier transient grating technique. The data showed …

On the transport equations in popular commercial device simulators

ME Levinshtein, TT Mnatsakanov - IEEE Transactions on …, 2002 - ieeexplore.ieee.org
The transport formulation used in many commercial semiconductor device simulators (for
example DESSIS, ATLAS, and MEDICI) does not allow accurate modeling of electron-hole …

Breakdown phenomena in semiconductors and semiconductor devices

ME Levinshtein, J Kostamovaara… - International journal of …, 2004 - World Scientific
Systematic studies of breakdown phenomena in solids began more than 80 years ago, in
the early 1920s. Approximately at the same time it was found that the scenario for …

О пределе инжектирующей способности кремниевых -переходов, обусловленном влиянием фундаментальных физических эффектов

ТТ Мнацаканов, МЕ Левинштейн, ВБ Шуман… - Физика и техника …, 2017 - mathnet.ru
С учетом совокупности нелинейных физических эффектов: электронно-дырочного
рассеяния, оже-рекомбинации, сужения ширины запрещенной зоны, нелинейной …

Generalised drift-diffusion model of bipolar transport in semiconductors

D Reznik - Simulation of Semiconductor Devices and Processes …, 1995 - Springer
A generalisation of the conventional relaxation-time approximation for bipolar transport with
electron-hole scattering is presented. A simple phenomenological ansatz leads to …

Relaxation of high-energy heavy-ion induced bipolar plasmas in Si epilayer devices as a function of temperature

JS Laird, S Onoda, T Hirao - Journal of Applied Physics, 2008 - pubs.aip.org
The electronic energy loss of high-energy heavy ions striking a reverse biased junction in an
electronic component designed for space induces an electron-hole pair (or bipolar) plasma …

Effect of nonlinear physical phenomena on the photovoltaic effect in silicon p+–n–n+ solar cells

TT Mnatsakanov, VB Shuman, LI Pomortseva… - Solid-State …, 2000 - Elsevier
The influence of the combined effects of high injection level and heavy doping on the
characteristics of silicon p+–n–n+ solar cells is examined. The total amount of nonlinear …

On the limit of the injection ability of silicon p +n junctions as a result of fundamental physical effects

TT Mnatsakanov, ME Levinshtein, VB Shuman… - Semiconductors, 2017 - Springer
Analytical expressions describing the dependences of the p+–n-junction leakage current on
the doping level of the p+-type region are derived by taking into account a whole set of …