ME Levinshtein, TT Mnatsakanov… - Semiconductor …, 2011 - iopscience.iop.org
In this paper, ways to create silicon carbide p+-emitters with high injection coefficients are considered. Raising the emitter doping level, eliminating the deteriorated layer, and making …
P Grivickas, J Linnros, V Grivickas - Journal of Materials Research, 2001 - cambridge.org
Carrier diffusivity has been experimentally determined in low-doped n-type epitaxial 4H–SiC over a wide injection range using a Fourier transient grating technique. The data showed …
ME Levinshtein, TT Mnatsakanov - IEEE Transactions on …, 2002 - ieeexplore.ieee.org
The transport formulation used in many commercial semiconductor device simulators (for example DESSIS, ATLAS, and MEDICI) does not allow accurate modeling of electron-hole …
ME Levinshtein, J Kostamovaara… - International journal of …, 2004 - World Scientific
Systematic studies of breakdown phenomena in solids began more than 80 years ago, in the early 1920s. Approximately at the same time it was found that the scenario for …
D Reznik - Simulation of Semiconductor Devices and Processes …, 1995 - Springer
A generalisation of the conventional relaxation-time approximation for bipolar transport with electron-hole scattering is presented. A simple phenomenological ansatz leads to …
JS Laird, S Onoda, T Hirao - Journal of Applied Physics, 2008 - pubs.aip.org
The electronic energy loss of high-energy heavy ions striking a reverse biased junction in an electronic component designed for space induces an electron-hole pair (or bipolar) plasma …
The influence of the combined effects of high injection level and heavy doping on the characteristics of silicon p+–n–n+ solar cells is examined. The total amount of nonlinear …
Analytical expressions describing the dependences of the p+–n-junction leakage current on the doping level of the p+-type region are derived by taking into account a whole set of …