Radiation effects in SiGe technology

JD Cressler - IEEE transactions on Nuclear Science, 2013 - ieeexplore.ieee.org
Silicon-Germanium (SiGe) technology effectively merges the desirable attributes of
conventional silicon-based CMOS manufacturing (high integration levels, at high yield and …

Silicon-germanium as an enabling technology for extreme environment electronics

JD Cressler - IEEE transactions on device and materials …, 2010 - ieeexplore.ieee.org
“Extreme environment” electronics represent an important niche market in the trillion dollar
global electronics industry and span the operation of electronic circuits and systems in …

[图书][B] Radiation effects in semiconductors

K Iniewski - 2018 - taylorfrancis.com
Space applications, nuclear physics, military operations, medical imaging, and especially
electronics (modern silicon processing) are obvious fields in which radiation damage can …

An evaluation of transistor-layout RHBD techniques for SEE mitigation in SiGe HBTs

AK Sutton, M Bellini, JD Cressler… - … on Nuclear Science, 2007 - ieeexplore.ieee.org
We investigate transistor-level layout-based techniques for SEE mitigation in advanced SiGe
HBTs. The approach is based on the inclusion of an alternate reverse-biased pn junction (n …

Comparison of single-event transients in SiGe HBTs on bulk and thick-film SOI

A Ildefonso, GN Tzintzarov, D Nergui… - … on Nuclear Science, 2019 - ieeexplore.ieee.org
A comparison of heavy-ion-induced single-event transients (SETs) in silicon-germanium
heterojunction bipolar transistors (SiGe HBTs) fabricated on both bulk and silicon-on …

Heavy ion microbeam-and broadbeam-induced transients in SiGe HBTs

JA Pellish, RA Reed, D McMorrow… - … on Nuclear Science, 2009 - ieeexplore.ieee.org
Silicon-germanium heterojunction bipolar transistor (SiGe HBT) heavy ion-induced current
transients are measured using Sandia National Laboratories' microbeam and high-and low …

RHBD techniques to mitigate SEU and SET in CMOS frequency synthesizers

V Díez-Acereda, S L. Khemchandani, J Del Pino… - Electronics, 2019 - mdpi.com
This paper presents a thorough study of radiation effects on a frequency synthesizer
designed in a 0.18 μ m CMOS technology. In CMOS devices, the effect of a high energy …

Circuit-level design approaches for radiation-hard digital electronics

R Garg, N Jayakumar, SP Khatri… - IEEE transactions on …, 2009 - ieeexplore.ieee.org
In this paper, we present a novel circuit design approach for radiation hardened digital
electronics. Our approach is based on the use of shadow gates, whose task it is to protect …

Single-event transients in SiGe HBTs induced by pulsed X-ray microbeam

D Nergui, A Ildefonso, GN Tzintzarov… - … on Nuclear Science, 2019 - ieeexplore.ieee.org
This article presents an experimental study of single-event transients (SETs) induced by
pulsed X-rays in SiGe heterojunction bipolar transistors (HBTs). Device-level transient data …

SiGe BiCMOS technology: An IC design platform for extreme environment electronics applications

JD Cressler - 2007 IEEE International Reliability Physics …, 2007 - ieeexplore.ieee.org
The drivers in the extreme environment electronics community are beginning to perk up their
ears to the possibilities of using SiGe technology, especially for space electronics …