Role of simulation technology for the progress in power devices and their applications

H Ohashi, I Omura - IEEE Transactions on Electron Devices, 2013 - ieeexplore.ieee.org
The modern power electronics era started with the commercialization of the silicon-
controlled rectifier in 1957, since when power electronics systems have been installed in a …

SiC-based electronics (100th anniversary of the Ioffe Institute)

AA Lebedev, PA Ivanov, ME Levinshtein… - Physics …, 2019 - iopscience.iop.org
We review the history and modern state of silicon carbide and SiC-based devices. The main
techniques for growing bulk SiC crystals and epitaxial SiC films are discussed. Epitaxial SiC …

Analytical and numerical studies of p+-emitters in silicon carbide bipolar devices

ME Levinshtein, TT Mnatsakanov… - Semiconductor …, 2011 - iopscience.iop.org
In this paper, ways to create silicon carbide p+-emitters with high injection coefficients are
considered. Raising the emitter doping level, eliminating the deteriorated layer, and making …

Temperature dependence of the current gain in power 4H-SiC NPN BJTs

PA Ivanov, ME Levinshtein, AK Agarwal… - IEEE transactions on …, 2006 - ieeexplore.ieee.org
For 1-kV 30-A 4H-SiC epitaxial emitter npn bipolar junction transistors, the dependences of
the common-emitter current gain/spl beta//sub CE/on the collector current I/sub C/were …

An Analytical Model of the Switching Behavior of 4H-SiC p $^{\bm+} $-nn $^{\bm+} $ Diodes from Arbitrary Injection Conditions

S Bellone, FG Della Corte… - IEEE transactions on …, 2011 - ieeexplore.ieee.org
An analytical model of the switching behavior of SiC diodes is presented. The model gives
an accurate description of the current and voltage transient for a wide range of reverse to …

High power 4H–SiC PiN diodes (10 kV class) with record high carrier lifetime

PA Ivanov, ME Levinshtein, JW Palmour, MK Das… - Solid-State …, 2006 - Elsevier
The hole lifetime τp in the n-base and isothermal (pulse) current–voltage characteristics
have been measured in 4H–SiC diodes with a 10kV blocking voltage (100μm base width) …

Numerical study of the turnoff behavior of high-voltage 4H-SiC IGBTs

T Tamaki, GG Walden, Y Sui… - IEEE transactions on …, 2008 - ieeexplore.ieee.org
Numerical Study of the Turnoff Behavior of High-Voltage 4H-SiC IGBTs Page 1 1928 IEEE
TRANSACTIONS ON ELECTRON DEVICES, VOL. 55, NO. 8, AUGUST 2008 Numerical Study …

An analog circuit for accurate OCVD measurements

S Bellone, GD Licciardo - IEEE Transactions on Instrumentation …, 2008 - ieeexplore.ieee.org
An electronic circuit for making accurate open-circuit voltage decay measurements is
presented. The circuit overcomes the main limitations that occur in the standard method …

Specific features of switch-on processes in high-voltage (18 kV class) optically triggered 4H-SiC thyristors

TT Mnatsakanov, SN Yurkov… - Semiconductor …, 2014 - iopscience.iop.org
A computer simulation has been carried out to analyze and explain the specific features of
the switch-on process in super-high-voltage (18 kV class) optically triggered 4H-SiC …

[PDF][PDF] Мощные биполярные приборы на основе карбида кремния Обзор

ПА Иванов, МЕ Левинштейн… - Физика и техника …, 2005 - journals.ioffe.ru
В настоящее время освоение широкозонных материалов: карбида кремния SiC и
нитридов III-й группы—становится одним из главных направлений развития …