[PDF][PDF] A self-adaptive resilient method for implementing and managing the high-reliability processing system
J Chen - 2023 - researchgate.net
As a result of CMOS scaling, radiation-induced Single-Event Effects (SEEs) in electronic
circuits became a critical reliability issue for modern Integrated Circuits (ICs) operating under …
circuits became a critical reliability issue for modern Integrated Circuits (ICs) operating under …
A methodology for characterization, modeling and mitigation of single event transient effects in CMOS standard combinational cells
M Andjelkovic - 2021 - publishup.uni-potsdam.de
With the downscaling of CMOS technologies, the radiation-induced Single Event Transient
(SET) effects in combinational logic have become a critical reliability issue for modern …
(SET) effects in combinational logic have become a critical reliability issue for modern …
Radiation-Hardening-by-Design Triple Modular Redundancy Flip-Flop with Self-Correction
O Schrape, A Breitenreiter, L Lu… - 2024 IEEE Nordic …, 2024 - ieeexplore.ieee.org
Saving power is one of the most important things in space applications and power
consumption has a direct impact on system complexity and costs. One straightforward …
consumption has a direct impact on system complexity and costs. One straightforward …
Transistor-Level Radiation Hardening by Design Techniques in Complex Gates
BT Ferraz, H Kessler, VVA Camargo - Journal of Circuits, Systems …, 2022 - World Scientific
Single Event Transients (SETs) have become a major reliability concern for integrated
circuits used in critical applications. Research to improve the radiation robustness of digital …
circuits used in critical applications. Research to improve the radiation robustness of digital …