Abstract Low-Energy Ion Scattering (LEIS) spectrometry is extraordinarily sensitive and
specific to the outermost atomic layers of materials. It is a powerful tool for surface science …

Low-energy ion scattering (LEIS) is known for its extreme surface sensitivity, as it yields a
quantitative analysis of the outermost surface as well as highly resolved in-depth information …

Low energy ion scattering is an analytical technique with extreme surface sensitivity. It
enables qualitative and quantitative elemental analysis of the outermost atomic layer …

We explore under which conditions low-energy ion scattering experiments are capable of
obtaining reliable quantitative results in surface composition analysis. Additionally, we …

This work compares the charge exchange properties of a large set of pure elemental solid
targets by studying the neutralisation and reionisation in low-energy ion scattering (LEIS) …

Abstract Low Energy Ion Scattering (LEIS) has been performed on several lanthanum-based
surfaces. Strong subsurface matrix effects–dependence of surface scattered He+ ion yield …

Abstract Low Energy Ion Scattering (LEIS) analysis of bismuth selenide (Bi 2 Se 3), a strong
3D topological insulator, revealed oscillations of the detected signal in dependence on …

On the basis of numerical results obtained by solving simultaneous differential equations
derived from the Heisenberg equation of motion, we examined the influence of the Coulomb …

Polycarbonate targets were irradiated with multicharged ions of argon and oxygen with
kinetic energies between 375 eV and 1 keV. Scanning electron microscopy (SEM) and x-ray …

When slow ions incident on a surface are neutralized, the excess potential energy is passed
on to an electron inside the surface, leading to emission of secondary electrons. The …