Benchmarking monolayer MoS2 and WS2 field-effect transistors

A Sebastian, R Pendurthi, TH Choudhury… - Nature …, 2021 - nature.com
Here we benchmark device-to-device variation in field-effect transistors (FETs) based on
monolayer MoS2 and WS2 films grown using metal-organic chemical vapor deposition …

Functional devices from bottom-up Silicon nanowires: A review

T Arjmand, M Legallais, TTT Nguyen, P Serre… - Nanomaterials, 2022 - mdpi.com
This paper summarizes some of the essential aspects for the fabrication of functional
devices from bottom-up silicon nanowires. In a first part, the different ways of exploiting …

Analytical modeling and doping optimization for enhanced analog performance in a Ge/Si interfaced nanowire MOSFET

A Das, S Rewari, BK Kanaujia, SS Deswal… - Physica …, 2023 - iopscience.iop.org
This paper critically investigates the effect of doping on different device characteristics of a
Ge/Si interfaced nanowire MOSFET (GSI-NWM) for analog performance enhancement. The …

Current status of reliability in extended and beyond CMOS devices

AE Islam - IEEE Transactions on Device and Materials …, 2014 - ieeexplore.ieee.org
In the history of electronics, solid-state materials replaced the vacuum parts to reduce power
consumption and to obtain better reliability at a reduced cost. The size of solid-state …

Improvement in self-heating characteristic by incorporating hetero-gate-dielectric in gate-all-around MOSFETs

YS Song, JH Kim, G Kim, HM Kim… - IEEE Journal of the …, 2020 - ieeexplore.ieee.org
For improving self-heating effects (SHEs) in gate-all-around metal-oxide-semiconductor field-
effect transistors (GAA MOSFETs), hetero-gate-dielectric (HGD) is utilized. The HGD consists …

Performance Potential and Limit of MoS2 Transistors

X Li, L Yang, M Si, S Li, M Huang, P Ye… - Advanced …, 2015 - Wiley Online Library
DOI: 10.1002/adma. 201405068 and measured by atomic force microscopy (AFM) as shown
in Figure 1 b, c, the thickness of which is around 6 nm, corresponding to about 9 layers …

Direct observation of self-heating in III–V gate-all-around nanowire MOSFETs

SH Shin, MA Wahab, M Masuduzzaman… - … on Electron Devices, 2015 - ieeexplore.ieee.org
Gate-all-around (GAA) MOSFETs use multiple nanowires (NWs) to achieve target, along
with excellent 3-D electrostatic control of the channel. Although the self-heating effect has …

Low-frequency noise and random telegraph noise on near-ballistic III-V MOSFETs

M Si, NJ Conrad, S Shin, J Gu, J Zhang… - … on Electron Devices, 2015 - ieeexplore.ieee.org
In this paper, we report the observation of random telegraph noise (RTN) in highly scaled
InGaAs gate-all-around (GAA) MOSFETs fabricated by a top-down approach. RTN and low …

Investigation of self-heating effects in gate-all-around MOSFETs with vertically stacked multiple silicon nanowire channels

JY Park, BH Lee, KS Chang, DU Kim… - … on Electron Devices, 2017 - ieeexplore.ieee.org
The self-heating effects (SHEs) in gate-all-around (GAA) MOSFETs with vertically stacked
silicon nanowire (SiNW) channels are investigated. Direct observations using thermal …

Characterization of self-heating leads to universal scaling of HCI degradation of multi-fin SOI FinFETs

H Jiang, SH Shin, X Liu, X Zhang… - 2016 IEEE International …, 2016 - ieeexplore.ieee.org
SOI FinFETs and other Gate-all-around (GAA) transistors topologies have excellent 3-D
electrostatic control and therefore, have been suggested as potential technology options for …