Enhancing scalable name-based forwarding

H Yuan, P Crowley, T Song - 2017 ACM/IEEE Symposium on …, 2017 - ieeexplore.ieee.org
Name-based forwarding is a core component in information-centric networks. Designing
scalable name-based forwarding solutions is challenging because name prefixes are of …

Efficient production binning using octree tessellation in the alternate measurements space

Á Gómez-Pau, L Balado… - IEEE Transactions on …, 2015 - ieeexplore.ieee.org
Binning after volume production is a widely accepted technique to classify fabricated
integrated circuits (ICs) into different clusters depending on different degrees of specification …

MS test based on specification validation using octrees in the measure space

Á Gómez-Pau, L Balado… - 2013 18th IEEE European …, 2013 - ieeexplore.ieee.org
Testing MS circuits is a difficult task demanding high amount of resources. To overcome
these drawbacks, indirect testing methods have been adopted as an efficient solution to …

Efficient loopback test for aperture jitter in embedded mixed-signal circuits

B Kim, JA Abraham - … Transactions on Circuits and Systems I …, 2011 - ieeexplore.ieee.org
Accurate measurement of aperture jitter for high-speed data converters is a difficult problem,
since aperture jitter should be precisely separated from other jitter components as well as …

Study of regression methodologies on analog circuit design

I Guerra-Gómez, T McConaghy… - 2015 16th Latin …, 2015 - ieeexplore.ieee.org
This paper benchmarks accuracy and speed of many regression techniques on medium and
large-scale circuit modelling problems, with particular emphasis on Gaussian Process …

Analog circuit test based on a digital signature

A Gómez, R Sanahuja, L Balado… - … Design, Automation & …, 2010 - ieeexplore.ieee.org
Production verification of analog circuit specifications is a challenging task requiring
expensive test equipment and time consuming procedures. This paper presents a method …

Quality metrics for mixed-signal indirect testing

A Gómez-Pau, L Balado… - Design of Circuits and …, 2014 - ieeexplore.ieee.org
Analog and mixed-signal circuit testing is a challenging task demanding large amounts of
resources. In order to battle against this drawback, alternate testing has been established as …

Diagnosis of parametric defects in dual axis IC accelerometers

Á Gómez-Pau, L Balado, J Figueras - Microsystem Technologies, 2015 - Springer
Microelectromechanical systems fabrication and packaging may induce parametric defects
which have to be efficiently diagnosed to improve fabrication yield and device reliability. In …

Indirect test of MS circuits using multiple specification band guarding

Á Gómez-Pau, L Balado, J Figueras - Integration, 2016 - Elsevier
Testing analog and mixed-signal circuits is a costly task due to the required test time targets
and high end technical resources. Indirect testing methods partially address these issues …

Mixed-signal test band guarding using digitally coded indirect measurements

Á Gómez-Pau, L Balado… - … Conference on Synthesis …, 2015 - ieeexplore.ieee.org
Testing analog and mixed-signal circuits is a costly task due to the required test time targets
and high end technical resources. Indirect testing methods partially address these issues …