Abstract General Purpose Graphics Processing Units (GPGPUs) have been extensively
used in the last decade as accelerators in high demanding applications, such as multimedia …

This work investigates the effects of aging and voltage scaling in neutron-induced bit-flip in
SRAM-based Field Programmable Gate Array (FPGA). Experimental results show that aging …

This paper studies the impact of aging and electromigration on mixed-signal CMOS ICs in
22nm FDSOI technology. Recently, this technology has received much attention in many …

In this paper, we analyze the effects of aging mechanisms on the soft error susceptibility of
both standard and robust latches. Particularly, we consider bias temperature instability (BTI) …

Soft errors, aging effects and process variations have become the three most critical
reliability issues for nanoscale complementary metal oxide semiconductor (CMOS) circuits …

Analyses recently presented in the literature have shown that the Bias Temperature
Instability (BTI) ageing phenomenon may increase significantly the susceptibility to soft …

Bias temperature instability (BTI) is recognised as the primary parametric failure mechanism
in nanometre integrated circuits (ICs). Due to the BTI-induced increase in transistor …

工艺尺寸的降低导致组合电路对软错误的敏感性越发突出, 由负偏置温度不稳定性(NBTI)
效应引起的老化现象越发不容忽视. 为了准确地评估集成电路在其生命周期不同阶段的软错误率 …

Soft-errors and aging are considered as two primary factors affecting the long-term reliability
of aerospace integrated circuits (ICs). As one of the key components in aerospace ICs …

Aging and soft errors have become the two most critical reliability issues for nano-scale
CMOS circuit. First, in this paper, the aging effect due to bias temperature instability (BTI) is …