Y Jin, Y Huan, H Chu, Z Zou… - 2018 IEEE International …, 2018 - ieeexplore.ieee.org
This work proposes a fault tolerant memory design using the method of Triple Module Redundancy (TMR) group coding to tolerant the Single-Event Upset (SEU) and Multi-Bit …
By the progress of Internet of Things (IoT) and the increasing number of connected nodes, new concepts such as edge and fog computing appeared to prohibit unneeded data transfer …