CF Poon, W Zhang, J Cho, S Ma… - IEEE Journal of Solid …, 2022 - ieeexplore.ieee.org
This article describes the design of a 1.24-pJ/b 112-Gb/s PAM4 transceiver test chip in 7-nm
FinFET for in-package die-to-die communication. The receiver supports 0–1.2-V input …