Enhanced ion yields using high energy water cluster beams for secondary ion mass spectrometry analysis and imaging

S Sheraz, H Tian, JC Vickerman… - Analytical …, 2019 - ACS Publications
Previous studies have shown that the use of a 20 keV water cluster beam as a primary beam
for the analysis of organic and bio-organic systems resulted in a 10–100 times increase in …

Mass spectrometric imaging of brain tissue by time‐of‐flight secondary ion mass spectrometry–How do polyatomic primary beams C60+, Ar2000+, water‐doped …

I Berrueta Razo, S Sheraz, A Henderson… - Rapid …, 2015 - Wiley Online Library
Rationale To discover the degree to which water‐containing cluster beams increase
secondary ion yield and reduce the matrix effect in time‐of‐flight secondary ion mass …

Sensitivity enhancement using chemically reactive gas cluster ion beams in secondary ion mass spectrometry (SIMS)

M Lagator, I Berrueta Razo, T Royle… - Surface and Interface …, 2022 - Wiley Online Library
We report for the first time on significant molecular secondary ion yield increases by
modifying the chemistry of a water cluster primary ion beam. This was demonstrated using …

Universal equation for argon cluster size-dependence of secondary ion spectra in SIMS of organic materials

MP Seah, R Havelund, IS Gilmore - The Journal of Physical …, 2014 - ACS Publications
A study has been made of the fragmentation of three organic molecules,
fluorenylmethyloxycarbonyl-l-pentafluorophenylalanine, tris (8-hydroxyquinolinato) …

Macromolecular Sample Sputtering by Large Ar and CH4 Clusters: Elucidating Chain Size and Projectile Effects with Molecular Dynamics

A Delcorte, M Debongnie - The Journal of Physical Chemistry C, 2015 - ACS Publications
This article reports the latest developments of our theoretical studies of gas cluster
bombardment of model macromolecular samples using molecular dynamics simulations …

Angle dependence of argon gas cluster sputtering yields for organic materials

MP Seah, SJ Spencer, AG Shard - The Journal of Physical …, 2015 - ACS Publications
The first angle-dependent measurements of the sputtering yield of an organic material using
argon gas cluster ions under a wide range of conditions are reported in order to develop an …

Fundamental aspects of Arn+ SIMS profiling of common organic semiconductors

C Fleischmann, T Conard, R Havelund… - Surface and …, 2014 - Wiley Online Library
We investigate the capabilities and limitations of performing (quantitative) in‐depth
composition analysis of polymer: fullerene blends, using time‐of‐flight SIMS with large Arn+ …

Large molecular cluster formation from liquid materials and its application to ToF-SIMS

K Moritani, S Nagata, A Tanaka, K Goto, N Inui - Quantum Beam Science, 2021 - mdpi.com
Since molecular cluster ion beams are expected to have various chemical effects, they are
promising candidates for improving the secondary ion yield of Tof-SIMS. However, in order …

Improvement of the gas cluster ion beam-(GCIB)-based molecular secondary ion mass spectroscopy (SIMS) depth profile with O 2+ cosputtering

YH Chu, HY Liao, KY Lin, HY Chang, WL Kao, DY Kuo… - Analyst, 2016 - pubs.rsc.org
Over the last decade, cluster ion beams have displayed their capability to analyze organic
materials and biological specimens. Compared with atomic ion beams, cluster ion beams …

Computer simulations of cluster impacts: effects of the atomic masses of the projectile and target

OA Restrepo, X Gonze, P Bertrand… - Physical Chemistry …, 2013 - pubs.rsc.org
Cluster secondary ion mass spectrometry is now widely used for the characterization of
nanostructures. In order to gain a better understanding of the physics of keV cluster …