Lithography and other patterning techniques for future electronics

RF Pease, SY Chou - Proceedings of the IEEE, 2008 - ieeexplore.ieee.org
For all technologies, from flint arrowheads to DNA microarrays, patterning the functional
material is crucial. For semiconductor integrated circuits (ICs), it is even more critical than for …

Radiation chemistry in chemically amplified resists

T Kozawa, S Tagawa - Japanese Journal of Applied Physics, 2010 - iopscience.iop.org
Historically, in the mass production of semiconductor devices, exposure tools have been
repeatedly replaced with those with a shorter wavelength to meet the resolution …

[图书][B] Microlithography: science and technology

BW Smith, K Suzuki - 2018 - taylorfrancis.com
This new edition of the bestselling Microlithography: Science and Technology provides a
balanced treatment of theoretical and operational considerations, from elementary concepts …

Extreme ultraviolet patterning of tin-oxo cages

J Haitjema, Y Zhang, M Vockenhuber… - Journal of Micro …, 2017 - spiedigitallibrary.org
We report on the extreme ultraviolet (EUV) patterning performance of tin-oxo cages. These
cage molecules were already known to function as a negative tone photoresist for EUV …

Materials challenges for sub-20-nm lithography

JW Thackeray - Journal of Micro/Nanolithography, MEMS, and …, 2011 - spiedigitallibrary.org
We discuss the future of resist materials for sub-20-nm lithography and believe that polymer-
bound PAG-based resists will be used to 16-nm node. There has been enough progress in …

Protonation sites in chemically amplified resists for electron-beam lithography

K Natsuda, T Kozawa, K Okamoto… - Japanese journal of …, 2006 - iopscience.iop.org
In chemically amplified resists that utilize acid-catalytic reactions for pattern formation, proton
dynamics is important from the viewpoints of the insoluble layer formation due to acid loss …

Study of acid-base equilibrium in chemically amplified resist

K Natsuda, T Kozawa, K Okamoto… - Japanese Journal of …, 2007 - iopscience.iop.org
Protons generated in chemically amplified resists drive pattern formation reactions such as
acid catalytic deprotection reactions. Proton dynamics is controlled by the addition of base …

Photoresist latent and developer images as probed by neutron reflectivity methods

VM Prabhu, S Kang, DL VanderHart… - Advanced …, 2011 - Wiley Online Library
Photoresist materials enable the fabrication of advanced integrated circuits with ever‐
decreasing feature sizes. As next‐generation light sources are developed, using extreme …

EUV lithography development and research challenges for the 22 nm half-pitch

S Wurm - Journal of Photopolymer Science and Technology, 2009 - jstage.jst.go.jp
抄録 Extreme ultraviolet lithography (EUVL) is the main contender for high volume
semiconductor lithography patterning at the 22 nm half-pitch node. The most aggressive …

Characterization of the photoacid diffusion length and reaction kinetics in EUV photoresists with IR spectroscopy

S Kang, W Wu, KW Choi, A De Silva, CK Ober… - …, 2010 - ACS Publications
A soft-contact film transfer method was developed to prepare multilayer photoresist thin films
that enable high-resolution spectroscopic and reflectivity measurements for determining the …