Soft errors created due to propagation of single event transients are a significant reliability
challenge in modern VLSI. With advances in CMOS technology scaling, circuits become …

In this work, a programmable neuron is proposed to approximate the following activation
functions: sigmoid, hyperbolic tangent and linear. In other words, the neural network …

Beyond-edge devices can operate outside the reach of the power grid and without batteries.
Such devices can be deployed in large numbers in regions that are difficult to access. Using …

Due to the reduction in device feature size and supply voltage, achieving soft error reliability
in sub-micrometer digital circuits is becoming extremely challenging. We consider the …

The development of in chip manufacturing processes has enhanced energy-efficient nano-
electronic and high-performance devices in daily activities. In recent times, CMOS …

In a spacecraft, flip-flops take part in holding operational configuration for long durations.
Single event transients (SETs) at control inputs of such flip-flops can culminate in single …

This paper presents an implementation of Threshold Logic Units (TLU), the special case of
an Artificial Neural Network (ANN), using discrete circuit elements like memristors as …

As the progress of technology continues in accordance to Moore's law, the density and
downsizing of circuitry presents a significant vulnerability to the effects of soft errors. This …

Nowadays, radiation-induced Single Event Transients are a leading cause of critical errors
in CMOS nanometric integrated circuits. In this work, we propose a workflow for analyzing …

Memristive crossbar architecture with high device density is the most preferred structure to
realize memristor based in-memory computing system. Typically, synthesized gate-level …