Disentangling the impact of point defect density and carrier localization-enhanced auger recombination on efficiency droop in (In, Ga) N/GaN quantum wells

RM Barrett, JM McMahon, R Ahumada-Lazo… - ACS …, 2023 - ACS Publications
The internal quantum efficiency of (In, Ga) N/GaN quantum wells can surpass 90% for blue-
emitting structures at moderate drive current densities but decreases significantly for longer …

Optical Characterization of InGaN Quantum Structures at the Nanoscale

WY Fu, HW Choi - Advanced Quantum Technologies, 2024 - Wiley Online Library
This review paper presents an overview of the optical characterization techniques for Indium
Gallium Nitride (InGaN) quantum well (QW) structures at a nanoscale. The two major …

[HTML][HTML] The nature of carrier localisation in polar and nonpolar InGaN/GaN quantum wells

P Dawson, S Schulz, RA Oliver, MJ Kappers… - Journal of Applied …, 2016 - pubs.aip.org
In this paper, we compare and contrast the experimental data and the theoretical predictions
of the low temperature optical properties of polar and nonpolar InGaN/GaN quantum well …

[HTML][HTML] Effects of quantum well growth temperature on the recombination efficiency of InGaN/GaN multiple quantum wells that emit in the green and blue spectral …

S Hammersley, MJ Kappers, FCP Massabuau… - Applied Physics …, 2015 - pubs.aip.org
InGaN-based light emitting diodes and multiple quantum wells designed to emit in the green
spectral region exhibit, in general, lower internal quantum efficiencies than their blue …

[HTML][HTML] The ABC model of recombination reinterpreted: Impact on understanding carrier transport and efficiency droop in InGaN/GaN light emitting diodes

MA Hopkins, DWE Allsopp, MJ Kappers… - Journal of Applied …, 2017 - pubs.aip.org
The efficiency of light emitting diodes (LEDs) remains a topic of great contemporary interest
due to their potential to reduce the amount of energy consumed in lighting. The current …

[HTML][HTML] Scanning capacitance microscopy of GaN-based high electron mobility transistor structures: A practical guide

C Chen, S Ghosh, F Adams, MJ Kappers, DJ Wallis… - Ultramicroscopy, 2023 - Elsevier
The scanning capacitance microscope (SCM) is a powerful tool to characterise local
electrical properties in GaN-based high electron mobility transistor (HEMT) structures with …

Lattice location of Mg in GaN: a fresh look at doping limitations

U Wahl, LM Amorim, V Augustyns, A Costa… - Physical Review Letters, 2017 - APS
Radioactive M 27 g (t 1/2= 9.5 min) was implanted into GaN of different doping types at
CERN's ISOLDE facility and its lattice site determined via β− emission channeling. Following …

Indium clustering in a-plane InGaN quantum wells as evidenced by atom probe tomography

F Tang, T Zhu, F Oehler, WY Fu, JT Griffiths… - Applied Physics …, 2015 - pubs.aip.org
Atom probe tomography (APT) has been used to characterize the distribution of In atoms
within non-polar a-plane InGaN quantum wells (QWs) grown on a GaN pseudo-substrate …

Improving modulation bandwidth of c-plane GaN-based light-emitting diodes by an ultra-thin quantum wells design

K Rajabi, J Wang, J Jin, Y Xing, L Wang, Y Han… - Optics express, 2018 - opg.optica.org
The GaN-based light emitting diodes (LEDs) have a great potential for visible light
communication (VLC) due to their ubiquitous application in general lighting, but the …

On the chemical homogeneity of InxGa1− xN alloys–Electron microscopy at the edge of technical limits

P Specht, C Kisielowski - Materials Science in Semiconductor Processing, 2017 - Elsevier
Abstract Ternary In x Ga 1− x N alloys became technologically attractive when p-doping was
achieved to produce blue and green light emitting diodes (LED) s. Starting in the mid …