Atomic force microscopy (AFM) is a key tool for nanotechnology research and finds its
principal application in the determination of surface topography. However, the use of the …

Plasma etching, a conventional technique in semiconductor industry, has exhibited great
potentials in fabricating nanoscale patterns by taking advantage of its high anisotropic …

A considerable cost reduction could be achieved in photovoltaics if efficient solar cells could
be made from polycrystalline‐silicon (pc‐Si) thin films on inexpensive substrates. We …

Localized alternating current (ac) impedance measurements are acquired directly through a
conductive atomic force microscope (AFM) tip. Both a spectroscopy mode (where full …

As emphasized in the International Technological Roadmap for Semiconductors (ITRS), two-
dimensional carrier profiling is one of the key elements in support of technology …

Metal-oxide-based resistive random access memory (RRAM) is a predominant candidate for
future non-volatile memories. In this Letter, we report on an innovative technique to observe …

Nanoelectronics is changing the way the world communicates, and is transforming our daily
lives. Continuing Moore's law and miniaturization of low-power semiconductor chips with …

Abstract C (sp3) C‐bonded diamond nanowires are wide band gap semiconductors that
exhibit a combination of superior properties such as negative electron affinity, chemical …

B-doped diamond has become the ultimate material for applications in the field of
microelectromechanical systems (MEMS), which require both highly wear resistant and …

In the last two decades, scanning probe microscopies (SPMs) have become the primary tool
for addressing structure and electronic, mechanical, optical, and transport phenomena on …