Non-additive sputtering of niobium and tantalum as neutral and charged clusters

SF Belykh, VV Palitsin, IV Veryovkin, A Adriaens… - Nuclear Instruments and …, 2003 - Elsevier
An analysis of available literature data on both positive ion emission from Nb and Ta
bombarded with 6 keV/atom Aum− atomic and molecular ions (m= 1, 2, 3) and positive …

Yields and ionization probabilities of sputtered Inn particles under atomic and polyatomic Aum− ion bombardment

AV Samartsev, A Wucher - Applied surface science, 2006 - Elsevier
The emission of neutral and charged atoms and clusters from a polycrystalline indium
surface under bombardment with 5 and 10keV Au, Au2, Au3 and Au5 projectiles was …

Nuclear and electronic sputtering induced by high energy heavy ions

N Imanishi, S Ninomiya - Journal of Nuclear and Radiochemical …, 2004 - jstage.jst.go.jp
This review focuses on recent fruitful findings of dependence of sputtering phenomena on
solid-state property and secondary particle species in the field of interaction of MeV-energy …

Effect of projectile parameters on charge state formation of sputtered atoms

SF Belykh, VV Palitsin, A Adriaens, F Adams - Physical Review B, 2002 - APS
In the majority of the electron-exchange models, it is assumed that the charge state
formation processes of atoms sputtered (scattered) from a solid do not depend on projectile …

Material-dependent emission mechanism of secondary atomic ions from solids under MeV-energy heavy ion bombardment

S Ninomiya, N Imanishi, J Xue, S Gomi… - Nuclear Instruments and …, 2002 - Elsevier
Yields and emission energy distributions of secondary ions have been measured for GaP
and GaAs targets bombarded by MeV-energy Si ions for studying roles of the electronic …

Sputtering of indium using polyatomic projectiles

AV Samartsev, A Wucher - Applied surface science, 2004 - Elsevier
We have investigated the emission of neutral and charged particles from a polycrystalline
indium surface under bombardment with Au, Au2, Au3, Au5 and AuCs2 projectiles with …

Mechanism of metal cationization in organic SIMS

I Wojciechowski, A Delcorte, X Gonze… - Chemical physics letters, 2001 - Elsevier
A mechanism for metal cationization of phenyl group containing hydrocarbons is discussed.
Intact molecules and their fragments are emitted from a thin organic layer covering a metal …

Material dependence of electronic sputtering induced by MeV-energy heavy ions

S Ninomiya, N Imanishi - Vacuum, 2004 - Elsevier
Masses, yields and emission energies of secondary ions have been systematically
measured for solid targets bombarded by Si ions over an energy range between 0.5 and …

Correlation between molecular secondary ion yield and cluster ion sputtering for samples with different stopping powers

A Heile, C Muhmann, D Lipinsky, HF Arlinghaus - Applied surface science, 2012 - Elsevier
In static SIMS, the secondary ion yield, defined as detected ions per primary ion, can be
increased by altering several primary ion parameters. For many years, no quantitative …

CHARACTERIZATION OF Al+ SECONDARY ION EMISSION PRODUCED BY Ne+ AND Ar+ BOMBARDMENT OF ALUMINIUM SURFACE

A Tolstogouzov, SF Belykh, M Stepanova… - Surface Review and …, 2004 - World Scientific
This paper reports the characterization of the velocity (energy) dependencies of the Al+
secondary ion emission produced by 0.5 keV and 5 keV Ne+ and Ar+ bombardment of …