[图书][B] Electronic design automation: synthesis, verification, and test

LT Wang, YW Chang, KTT Cheng - 2009 - books.google.com
This book provides broad and comprehensive coverage of the entire EDA flow. EDA/VLSI
practitioners and researchers in need of fluency in an" adjacent" field will find this an …

Microprocessor software-based self-testing

M Psarakis, D Gizopoulos, E Sanchez… - IEEE Design & Test of …, 2010 - ieeexplore.ieee.org
This article discusses the potential role of software-based self-testing in the microprocessor
test and validation process, as well as its supplementary role in other classic functional-and …

A scalable and highly available web server

DM Dias, W Kish, R Mukherjee… - … '96. Technologies for the …, 1996 - ieeexplore.ieee.org
We describe a prototype scalable and highly available web server, built on an IBM SP-2
system, and analyze its scalability. The system architecture consists of a set of logical front …

Development flow for on-line core self-test of automotive microcontrollers

P Bernardi, R Cantoro, S De Luca… - IEEE Transactions …, 2015 - ieeexplore.ieee.org
Software-Based Self-Test is an effective methodology for devising the online testing of
Systems-on-Chip. In the automotive field, a set of test programs to be run during mission …

Scalable detection of hardware trojans using ATPG-based activation of rare events

A Jayasena, P Mishra - … Aided Design of Integrated Circuits and …, 2023 - ieeexplore.ieee.org
Semiconductor supply chain vulnerability is a major concern in designing trustworthy
systems. Malicious implants, popularly known as hardware Trojans (HTs), can get …

Automatic test program generation using executing-trace-based constraint extraction for embedded processors

Y Zhang, H Li, X Li - IEEE Transactions on Very Large Scale …, 2012 - ieeexplore.ieee.org
Software-based self-testing (SBST) has been a promising method for processor testing, but
the complexity of the state-of-art processors still poses great challenges for SBST. This …

Reinforcement-learning-based test program generation for software-based self-test

CY Chen, JL Huang - 2019 IEEE 28th Asian Test Symposium …, 2019 - ieeexplore.ieee.org
Software-based Self-test (SBST) has been recognized as a promising complement to scan-
based structural Built-in Self-test (BIST), especially for in-field self-test applications. In …

Software-based self-testing using bounded model checking for out-of-order superscalar processors

Y Zhang, K Chakrabarty, Z Peng… - … on Computer-Aided …, 2019 - ieeexplore.ieee.org
Generating functional tests for processors has been a challenging problem for decades in
the very large-scale integration testing field. This paper presents a method that generates …

Design of a step-up/step-down k (= 2, 3,...)-fibonacci dc-dc converter designed by switched-capacitor techniques

K Eguchi, S Hirata, M Shimoji… - 2012 Fifth International …, 2012 - ieeexplore.ieee.org
A step-up/step-down k (= 2, 3,...)-Fibonacci switched-capacitor (SC) DC-DC converter is
proposed in this paper. Unlike conventional Fibonacci step-up converter, the proposed …

Software-based self-testing of processors using expanded instructions

Y Zhang, H Li, X Li - 2010 19th IEEE Asian Test Symposium, 2010 - ieeexplore.ieee.org
In this paper, an automatic test instruction generation (ATIG) technique using expanded
instructions is presented for software-based self-testing (SBST) of processors. First …