Radiation damage in wide and ultra-wide bandgap semiconductors

SJ Pearton, A Aitkaliyeva, M Xian, F Ren… - ECS Journal of Solid …, 2021 - iopscience.iop.org
The wide bandgap semiconductors SiC and GaN are already commercialized as power
devices that are used in the automotive, wireless, and industrial power markets, but their …

Ionizing radiation defects and reliability of Gallium Nitride-based III-V semiconductor devices: a comprehensive review

V Sandeep, JC Pravin, SA Kumar - Microelectronics Reliability, 2024 - Elsevier
The remote sensing and satellite community working for space organizations have
expressed interest in building advanced devices with potential choices for Gallium Nitride …

Disorder-induced ordering in gallium oxide polymorphs

A Azarov, C Bazioti, V Venkatachalapathy… - Physical Review Letters, 2022 - APS
Polymorphs are common in nature and can be stabilized by applying external pressure in
materials. The pressure and strain can also be induced by the gradually accumulated …

Hybrid van der Waals Epitaxy

L Hu, D Liu, F Zheng, X Yang, Y Yao, B Shen… - Physical Review Letters, 2024 - APS
The successful growth of non–van der Waals (vdW) group-III nitride epilayers on vdW
substrates not only opens an unprecedented opportunity to obtain high-quality …

Heavy ion irradiation induced failure of gallium nitride high electron mobility transistors: effects of in-situ biasing

MAJ Rasel, R Schoell, NS Al-Mamun… - Journal of Physics D …, 2023 - iopscience.iop.org
While radiation is known to degrade AlGaN/GaN high-electron-mobility transistors (HEMTs),
the question remains on the extent of damage governed by the presence of an electrical …

Modeling Time‐Resolved Kinetics in Solids Induced by Extreme Electronic Excitation

N Medvedev, F Akhmetov… - Advanced Theory …, 2022 - Wiley Online Library
The authors present a concurrent Monte Carlo (MC)–molecular dynamics (MD) approach to
modeling matter response to excitation of its electronic system at nanometric scales. The two …

Investigation of the Efficiency of Shielding Gamma and Electron Radiation Using Glasses Based on TeO2-WO3-Bi2O3-MoO3-SiO to Protect Electronic Circuits …

A Kozlovskiy, DI Shlimas, MV Zdorovets, E Popova… - Materials, 2022 - mdpi.com
This article considers the effect of MoO3 and SiO additives in telluride glasses on the
shielding characteristics and protection of electronic microcircuits operating under …

An insider view of the Portuguese ion beam laboratory

E Alves, K Lorenz, N Catarino, M Peres… - … Physical Journal Plus, 2021 - epjplus.epj.org
Accelerators are behind many major scientific and technological breakthroughs giving a
gigantic contribution to unveil the mysteries of matter. This quest continues nowadays using …

Examining Different Regimes of Ionization‐Induced Damage in GaN Through Atomistic Simulations

MC Sequeira, F Djurabekova, K Nordlund, JG Mattei… - Small, 2022 - Wiley Online Library
The widespread adoption of gGaN in radiation‐hard semiconductor devices relies on a
comprehensive understanding of its response to strongly ionizing radiation. Despite being …

Failure mechanisms of AlGaN/GaN HEMTs irradiated by high-energy heavy ions with and without bias

PP Hu, LJ Xu, SX Zhang, PF Zhai, L Lv, XY Yan… - Nuclear Science and …, 2025 - Springer
Gallium nitride (GaN)-based devices have significant potential for space applications.
However, the mechanisms of radiation damage to the device, particularly from strong …