Quality factor (Q) is an important property of micro-and nano-electromechanical (MEM/NEM)
resonators that underlie timing references, frequency sources, atomic force microscopes …

Advances in microfabrication technology have enabled micromechanical systems (MEMS)
to become a core component in a manifold of applications. For many of these applications …

In this work, parametric noise squeezing and parametric resonance are realized through the
use of an electronic feedback circuit to excite a microcantilever with a signal proportional to …

We present a single-quadrature feedback scheme able to overcome the conventional 3 dB
limit on parametric squeezing. The method is experimentally demonstrated in a …

In tapping mode atomic force microscopy (AFM) the highly nonlinear tip–sample interaction
gives rise to a complicated dynamics of the microcantilever. Apart from the well-known …

We successfully demonstrated the first experimental stabilization of irregular and non-
periodic cantilever oscillation in the amplitude modulation atomic force microscopy using the …

It has been recently shown that microcantilever sensors in dynamic force microscopes
possibly exhibit chaotic oscillations due to the nonlinear tip-sample interaction force. In this …

Parametric resonance underpins the physics of swings, resonant surface waves, and
particle traps. There is increasing interest in its potential applications in atomic force …

This book focuses on the fabrication and applications of cantilever beams with nanoscale
dimensions. Nanometer-size mechanical structures show exceptional properties generated …

We propose to use a parametric amplification regime for small charge or potential difference
detection in electric force microscopy. First we give a simple method to accurately estimate …