This book provides broad and comprehensive coverage of the entire EDA flow. EDA/VLSI
practitioners and researchers in need of fluency in an" adjacent" field will find this an …

Modern electronics testing has a legacy of more than 40 years. The introduction of new
technologies, especially nanometer technologies with 90nm or smaller geometry, has …

We consider active data selection and test point rejection strategies for Gaussian process
regression based on the variance of the posterior over target values. Gaussian process …

CASP, Concurrent Autonomous chip self-test using S tored test P atterns, is a special kind of
self-test where a system tests itself concurrently during normal operation without any …

The knowledge required to develop complex software has historically existed in
programming folklore, the heads of experienced developers, or buried deep in the code …

Abstract Model compression techniques, such as pruning and quantization, are becoming
increasingly important to reduce the memory footprints and the amount of computations …

State estimation has a special role in the real-time control and monitoring of smart
distribution networks. State estimation process is typically based on network topology and …

There is mounting evidence that automatic test pattern generation tools capable of
producing tests with high coverage of defects occurring in the large semiconductor …

Test compaction and the associated test data compression are two key components of the
post-production test as they reduce test pattern counts, the resultant test data volume, test …

The run length based coding schemes have been very effective for the test data
compression in case of current generation SoCs with a large number of IP cores. The first …