Single-event upset responses of dual-and triple-well D flip-flop designs in 7-nm bulk FinFET...

Effect of cell placement on single-event transient pulse in a bulk finfet technology

P Huang, Z Zhao, Y Chi, B Liang, C Ma… - … on Nuclear Science, 2021 - ieeexplore.ieee.org
In this article, five different cell placement structures of a vertical inverter chain were
designed in a commercial bulk FinFET technology to investigate the effect of cell placement …
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