As very large-scale integration technology shrinks to fewer tracks per standard cell, eg, from
10 to 7.5-track libraries (and lesser for 7 nm), there has been a rapid increase in the usage …

The reliability of integrated circuits is increasingly endangered by migration-induced
degradation of metal interconnects. The risk of failure due to migration is not only rising in …

With the continuous scaling of integrated circuit (IC) technologies, electromigration (EM)
prevails as one of the major reliability challenges facing the design of robust circuits. With …

The aging and yield issues arise with aggressive scaling of technologies and increasing
design complexity [51, 53]. These issues impact the circuit performance and functionality …

Modern society relies on technologies with integrated circuits (ICs) at their heart. In the last
several decades, as the performance and complexity of ICs keep escalating, the …

Very-large-scale integrated (VLSI) circuits have entered the era of 1x nm technology node
and beyond. Emerging manufacturing processes such as multiple patterning lithography, E …