Modern digital systems pose new challenges to reliability analysts. Systems may exhibit a
non-coherent behavior and time becomes an important element of the analysis due to aging …

The Birnbaum importance measure plays a central role in reliability analysis. It has initially
been introduced for coherent systems, where several of its properties hold and where its …

The design space exploration (DSE) of fault-tolerant multiprocessor systems is very
complex, as it contains three interacting NP-hard problems: 1) task hardening; 2) task …

Design Space Exploration (DSE) techniques for complex embedded systems must cope with
a huge variety of applications and target architectures as well as a wide spectrum of …

System reliability becomes one of the major design concerns in nanoscale VLSI
technologies. To cope with the increasing design complexity and the challenge of cost …

Importance measure analysis judges the relative importance of components in a system and
reveals how each component contributes to the system reliability. In the design of large and …

Reliability importance measures (IMs) support analysts in understanding the contributions of
components to the reliability of the system under investigation. This understanding can be of …

Transistor aging is a major reliability concern in nanoscale digital design, and addressing it
during high-level synthesis (HLS) is essential to enhance the lifetime of circuits. Motivated by …

With shrinking cell geometries, semiconductor devices encounter a wide variety of technical
challenges. Among them, the higher vulnerability of these de-vices to, eg, neutron-induced …

The increasing error susceptibility of semiconductor devices has put reliability in the focus of
modern design methodologies. Low-level techniques alone cannot economically tackle this …