Recent advances in Schottky barrier concepts

RT Tung - Materials Science and Engineering: R: Reports, 2001 - Elsevier
Theoretical models of Schottky-barrier height formation are reviewed. A particular emphasis
is placed on the examination of how these models agree with general physical principles …

Role of hot electrons and metal–oxide interfaces in surface chemistry and catalytic reactions

JY Park, LR Baker, GA Somorjai - Chemical reviews, 2015 - ACS Publications
Role of Hot Electrons and Metal–Oxide Interfaces in Surface Chemistry and Catalytic
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[HTML][HTML] The physics and chemistry of the Schottky barrier height

RT Tung - Applied Physics Reviews, 2014 - pubs.aip.org
The formation of the Schottky barrier height (SBH) is a complex problem because of the
dependence of the SBH on the atomic structure of the metal-semiconductor (MS) interface …

Electronic excitations by chemical reactions on metal surfaces

H Nienhaus - Surface Science Reports, 2002 - Elsevier
Dissipation of chemical energy released in exothermic reactions at metal surfaces may
happen adiabatically by creation of phonons or non-adiabatically by excitation of the …

Ballistic-electron emission microscopy (BEEM): Studies of metal/semiconductor interfaces with nanometer resolution

M Prietsch - Physics Reports, 1995 - Elsevier
Ballistic-electron emission microscopy (BEEM) is a relatively new technique, based on the
scanning-tunneling microscope, to study potential steps at interfaces with a lateral resolution …

Nanometer-scale test of the Tung model of Schottky-barrier height inhomogeneity

HJ Im, Y Ding, JP Pelz, WJ Choyke - Physical Review B, 2001 - APS
Abstract Tung has shown [Phys. Rev. B 45, 13 509 (1992)] that a range of “nonideal”
behaviors observed in metal/semiconductor (MS) Schottky diodes could be quantitatively …

Evidence of momentum conservation at a nonepitaxial metal/semiconductor interface using ballistic electron emission microscopy

LD Bell - Physical review letters, 1996 - APS
Ballistic-electron-emission microscopy (BEEM) spectroscopy has been performed on Au/Si
(111) structures as a function of Au thickness and temperature. At 77 K a direct signature of …

Fermi-level pinning position at the Au–InAs interface determined using ballistic electron emission microscopy

S Bhargava, HR Blank, V Narayanamurti… - Applied physics …, 1997 - pubs.aip.org
Ballistic electron emission microscopy (BEEM) has been used to determine the Fermi-level
pinning position at the Au/InAs interface. Using BEEM's three-terminal capabilities, collector …

Hot electron scattering processes in metal films and at metal-semiconductor interfaces

R Ludeke, A Bauer - Physical review letters, 1993 - APS
Ballistic electron emission spectroscopy is used to investigate current attenuations in thin
films of Pd/Si, from which the elastic and inelastic mean free paths are uniquely determined …

Ballistic electron transport through Au (111)/Si (111) and Au (111)/Si (100) interfaces

MK Weilmeier, WH Rippard, RA Buhrman - Physical Review B, 1999 - APS
Ballistic electron emission microscopy (BEEM) measurements have been made, as a
function of Au thickness, of Au (111)/Si (111) and Au (111)/Si (100) interfaces, fabricated and …