[图书][B] Lock-in thermography: Basics and use for evaluating electronic devices and materials

O Breitenstein, W Warta, MC Schubert - 2019 - books.google.com
In the last 7 years, the? rst edition of “Lock-in Thermography” has established as a reference
book for all users of this technique for investigating electronic devices, especially solar cells …

Lock-in thermography

O Breitenstein, M Langenkamp - … and Use for Functional Diagnostics of …, 2003 - Springer
With the greater availability and effectively falling prices of thermocameras, in the last years
thermography has developed from a rarely used technique towards an increasingly popular …

Characterizing the electrical properties of anisotropic, 3D-printed conductive sheets for sensor applications

A Dijkshoorn, M Schouten, G Wolterink… - IEEE Sensors …, 2020 - ieeexplore.ieee.org
This paper introduces characterization techniques to investigate electrical properties of 3D-
printed conductors. It presents the combination of a physical model to describe frequency …

Fault isolation in semiconductor product, process, physical and package failure analysis: Importance and overview

JM Chin, V Narang, X Zhao, MY Tay, A Phoa… - Microelectronics …, 2011 - Elsevier
Failure analysis plays a major role in all areas of the semiconductor company especially
during product development cycle, 1st silicon stage, or in wafer processes and fabrication as …

Lock-in-Thermography for 3-dimensional localization of electrical defects inside complex packaged devices

C Schmidt, F Altmann, C Grosse… - … for Testing and …, 2008 - dl.asminternational.org
It has been shown that microscopic Lock-in-Thermography (LiT) can be used for localization
of electrical active defects like shorts and resistive opens in integrated circuits. This paper …

Thermal failure analysis by IR lock-in thermography

O Breitenstein, C Schmidt, F Altmann… - … failure analysis desk …, 2011 - books.google.com
Thermal infrared (IR) microscopy has experienced a decisive technical improvement by the
application of Lock-in Thermography (LIT), which is commercially available for failure …

Non-destructive infrared lock-in thermal tests: update on the current defect detectability

AR Silva, M Vaz, SR Leite, J Mendes - Russian Journal of Nondestructive …, 2019 - Springer
Non-destructive testing (NDT) is one of the best alternatives to perform inspections and
maintenance operations in aerospace and aeronautics industries. In Lock-in Thermal Tests …

Dynamic lock-in thermography for operation mode-dependent thermally active fault localization

R Schlangen, H Deslandes, T Lundquist… - Microelectronics …, 2010 - Elsevier
Microscopic Lock-In Thermography (LIT) has proven unsurpassed capability for non-
destructive localization of thermally active defects like shorts or resistive opens, even …

Automated extraction of local defect resonance using the principal component analysis in lock-in ultrasonic vibrothermography

SA Ghorashi, F Honarvar, M Tabatabaeipour - Infrared Physics & …, 2020 - Elsevier
Ultrasonic vibrothermography is an emerging and promising nondestructive evaluation
technique used for detection of surface and sub-surface defects. The heat-generating …

Lock-in thermal test with corrected optical stimulation

A Ramos Silva, M Vaz, S Leite… - Quantitative InfraRed …, 2022 - Taylor & Francis
ABSTRACT Among the Non-Destructive Testing (NDT) techniques available today, Active
Infrared Thermal Testing (AIRTT) is certainly one of the most flexible and promising. The …