Decomposable and template polymers: Fundamentals and applications

E Uzunlar, J Schwartz… - Journal of …, 2016 - asmedigitalcollection.asme.org
Polymers can be used as temporary place holders in the fabrication of embedded air gaps in
a variety of electronic devices. Embedded air cavities can provide the lowest dielectric …

Airgap interconnects: Modeling, optimization, and benchmarking for backplane, pcb, and interposer applications

V Kumar, R Sharma, E Uzunlar, L Zheng… - IEEE Transactions …, 2014 - ieeexplore.ieee.org
Frequency and time domain models are developed for backplane (BP), printed circuit board
(PCB), and silicon interposer (SI) links using six-port transfer matrices (ABCD matrices) for …

Low-loss air-isolated through-silicon vias for silicon interposers

H Oh, PA Thadesar, GS May… - IEEE Microwave and …, 2016 - ieeexplore.ieee.org
An air-isolated through-silicon via (TSV) technique is proposed to reduce radio-frequency
(RF) losses in silicon interposers. A testbed containing air-isolated and conventional TSVs is …

Implementation of air-gap through-silicon-vias (TSVs) using sacrificial technology

C Huang, Q Chen, D Wu, Z Wang - IEEE Transactions on …, 2013 - ieeexplore.ieee.org
Using air-gaps to replace conventional silicon dioxide as the insulators of through-silicon-
vias (TSVs) has the possibility to improve the electrical performance and some thermal …

Thermal and electrical reliability tests of air-gap through-silicon vias

C Huang, R Liu, Z Wang - IEEE Transactions on Device and …, 2014 - ieeexplore.ieee.org
Through-silicon vias (TSVs) with air gaps as the isolators have been developed to reduce
the TSV capacitance and to solve the reliability problems associated with thermomechanical …

Thermal and electrical tests of air-gap TSV

C Huang, D Wu, Z Wang - 2014 IEEE 64th Electronic …, 2014 - ieeexplore.ieee.org
Using air-gaps instead of conventional silicon dioxide as the insulations of TSV has the
potential to improve the electrical performance and solve some thermal reliability issues of …

Low-Capacitance Through-Silicon-Vias With Combined Air/SiO2 Liners

C Huang, K Wu, Z Wang - IEEE Transactions on Electron …, 2015 - ieeexplore.ieee.org
Through-silicon-vias (TSVs) with air-gap insulators have the advantages of low capacitance
and low thermal stress. This paper reports the design, fabrication, and characterization of …

Mechanical reliability testing of air-gap through-silicon vias

C Huang, K Wu, Z Wang - IEEE Transactions on Components …, 2016 - ieeexplore.ieee.org
The use of air gaps instead of SiO 2 as insulators for through-silicon vias (TSVs) has been
demonstrated to reduce the thermal stresses and the TSV capacitance of a 3-D integrated …

Reliability assessment of ultra-low-k dielectric material and demonstration in advanced interposers

P Bhaskar, C Blancher, M Kathaperumal… - 2022 IEEE 72nd …, 2022 - ieeexplore.ieee.org
Polymer dielectrics have been used as build-up layers in 2.5 D interposers with multiple
redistribution layers (RDL). To achieve high interconnection densities with good electrical …

Design and fabrication of ultra low-loss, high-performance 3D chip-chip air-clad interconnect pathway

E Uzunlar, R Sharma, R Saha, V Kumar… - 2013 IEEE 63rd …, 2013 - ieeexplore.ieee.org
In this study, we are pursuing an ultra low-loss interconnect pathway for 3D chip-chip
connectivity, incorporating air-clad planar interconnects, air-clad TSVs, and gradual vertical …