Comparative determination of atomic boron and carrier concentration in highly boron doped nano-crystalline diamond

A Taylor, P Ashcheulov, P Hubík, Z Weiss… - Diamond and Related …, 2023 - Elsevier
We have compared the total boron content and hole carrier concentration values obtained
from various destructive and non-destructive quantification methods in boron doped nano …

Unveiling the microstructure and promising electrochemical performance of heavily phosphorus-doped diamond electrodes

S Baluchová, K Sung, Z Weiss, J Kopeček, L Fekete… - Electrochimica …, 2024 - Elsevier
The challenge of doping synthetic diamond with phosphorus stems from the atomic size
mismatch between phosphorus and carbon atoms, which previously hindered achieving …

[HTML][HTML] Autonomous sputter synthesis of thin film nitrides with composition controlled by Bayesian optimization of optical plasma emission

DM Fébba, KR Talley, K Johnson, S Schaefer… - APL Materials, 2023 - pubs.aip.org
Autonomous experimentation has emerged as an efficient approach to accelerate the pace
of material discovery. Although instruments for autonomous synthesis have become popular …

Low pressure-alternating current glow discharge ion source for mass spectrometry

L Shi, A Habib, L Bi, L Wen - International Journal of Mass Spectrometry, 2024 - Elsevier
For social security and safety, the sensitive explosives detection is crucial. Mass
spectrometry (MS), a unique technique that may immediately reveal information about …

[HTML][HTML] Advanced perspective on heavily phosphorus-doped diamond layers via optical emission spectroscopy

K Sung, SA Irimiciuc, M Novotný, Z Weiss, P Hubík… - APL Materials, 2025 - pubs.aip.org
Although heavily phosphorus-doped diamond (PDD) holds great potential for advanced
device applications, incorporating phosphorus into diamond remains challenging with …

[PDF][PDF] 基于SD-OCT 的辉光放电大尺寸溅射坑表面形貌检测方法

万真真, 刘少锋, 施宁, 沈懿璇, 赵亚宁… - Chinese Journal of …, 2024 - researching.cn
摘要辉光放电光谱仪可对镀层材料表面进行沿深度方向的逐层分布分析. 通过高精度光学或探针
式表面测量仪器可检测辉光溅射深度和坑形轮廓, 得到逐层溅射率, 坑形平整度等信息 …