Dynamic atomic force microscopy methods

R Garcıa, R Perez - Surface science reports, 2002 - Elsevier
In this report we review the fundamentals, applications and future tendencies of dynamic
atomic force microscopy (AFM) methods. Our focus is on understanding why the changes …

[图书][B] Scanning probe microscopy: the lab on a tip

E Meyer, HJ Hug, R Bennewitz - 2004 - Springer
Written by three leading experts in the field, this book describes and explains all essential
aspects of scanning probe microscopy. Emphasis is placed on the experimental design and …

Experimental aspects of dissipation force microscopy

C Loppacher, R Bennewitz, O Pfeiffer, M Guggisberg… - Physical Review B, 2000 - APS
Experimental aspects of measuring dissipation on atomic scale using large-amplitude
dynamic force microscopy are discussed. Dissipation versus distance curves reveal that …

Multiscale approach for simulations of Kelvin probe force microscopy with atomic resolution

A Sadeghi, A Baratoff, SA Ghasemi, S Goedecker… - Physical Review B …, 2012 - APS
The distance dependence and atomic-scale contrast recently observed in nominal contact
potential difference (CPD) signals simultaneously recorded by Kelvin probe force …

Friction and wear on the atomic scale

E Gnecco, R Bennewitz, O Pfeiffer, A Socoliuc… - Springer handbook of …, 2010 - Springer
Friction has long been the subject of research: the empirical da Vinci–Amontons friction laws
have been common knowledge for centuries. Macroscopic experiments performed by the …

Lateral-force measurements in dynamic force microscopy

O Pfeiffer, R Bennewitz, A Baratoff, E Meyer, P Grütter - Physical review B, 2002 - APS
Lateral forces between the tip of a force microscope and atomic-scale features on the
surface of a sample can be accurately measured in a noncontact mode. Feedback …

Decoupling conservative and dissipative forces in frequency modulation atomic force microscopy

A Labuda, Y Miyahara, L Cockins, PH Grütter - Physical Review B …, 2011 - APS
Experiments and theoretical calculations of conservative forces measured by frequency
modulation atomic force microscopy (FM-AFM) in vacuum are generally in reasonable …

Electromagnetic coupling on an atomic scale

J Aizpurua, G Hoffmann, SP Apell, R Berndt - Physical review letters, 2002 - APS
Light emission from a scanning tunneling microscope is used to investigate the
electromagnetic coupling (EMC) of a metal tip and a metal sample. Subatomic scale …

Imaging of atomic orbitals with the Atomic Force Microscope—experiments and simulations

FJ Gießibl, H Bielefeldt, S Hembacher… - Annalen der …, 2001 - Wiley Online Library
Atomic force microscopy (AFM) is a mechanical profiling technique that allows to image
surfaces with atomic resolution. Recent progress in reducing the noise of this technique has …

Interplay between Nonlinearity, Scan Speed, Damping, and Electronics<? format?> in Frequency Modulation Atomic-Force Microscopy

M Gauthier, R Pérez, T Arai, M Tomitori, M Tsukada - Physical review letters, 2002 - APS
Numerical simulations of the frequency modulation atomic force microscope, including the
whole dynamical regulation by the electronics, show that the cantilever dynamics is …