Instruction reliability analysis for embedded processors
A Azarpeyvand, ME Salehi, F Firouzi… - … IEEE Symposium on …, 2010 - ieeexplore.ieee.org
Advances in silicon technology and shrinking the feature size to nanometer scale make
unreliability of nano devices the most important concern of fault-tolerant designs. Soft error …
unreliability of nano devices the most important concern of fault-tolerant designs. Soft error …
Reliability analysis of embedded applications in non-uniform fault tolerant processors
ME Salehi, A Azarpeyvand, F Firouzi… - 2010 5th …, 2010 - ieeexplore.ieee.org
Soft error analysis has been greatly aided by the concept of Architectural vulnerability Factor
(AVF) and Architecturally Correct Execution (ACE). The AVF of a processor is defined as the …
(AVF) and Architecturally Correct Execution (ACE). The AVF of a processor is defined as the …
Analysis of single-event effects in embedded processors for non-uniform fault tolerant design
F Firouzi, ME Salehi, A Azarpeyvand… - … on Innovations in …, 2009 - ieeexplore.ieee.org
Advances in silicon technology and shrinking the feature size to nanometer scale make
unreliability of nano devices the most important concern of fault-tolerant designs. Design of …
unreliability of nano devices the most important concern of fault-tolerant designs. Design of …