Robustness evaluation of electrical characteristics of sub-22 nm FinFETs affected by physical variability
BM Kalasapati, SL Tripathi - Materials Today: Proceedings, 2022 - Elsevier
The physical parameters of digital devices have been affected by process variability The
paper is focused on subthreshold performance characterization of FET with Visual TCAD …
paper is focused on subthreshold performance characterization of FET with Visual TCAD …
FinFET Technology for Low‐Power Applications
B Madhavi, SL Tripathi, BS Ram - Design and Development of …, 2022 - Wiley Online Library
This chapter reviews advanced fin field‐effect transistor (FinFET) technology over
conventional type metal‐oxide‐semiconductor field‐effect transistor (MOSFET) to evaluate …
conventional type metal‐oxide‐semiconductor field‐effect transistor (MOSFET) to evaluate …