Some challenges and opportunities in reliability engineering
E Zio - IEEE Transactions on Reliability, 2016 - ieeexplore.ieee.org
Today's fast-pace evolving and digitalizing World is posing new challenges to reliability
engineering. On the other hand, the continuous advancement of technical knowledge and …
engineering. On the other hand, the continuous advancement of technical knowledge and …
A literature review on planning and analysis of accelerated testing for reliability assessment
Accelerated testing has been widely used for several decades. Started with accelerated life
tests with constant‐stress loadings, more interest has been focused prominently on …
tests with constant‐stress loadings, more interest has been focused prominently on …
A review of prognostic techniques for high-power white LEDs
B Sun, X Jiang, KC Yung, J Fan… - IEEE Transactions on …, 2016 - ieeexplore.ieee.org
High-power white light-emitting diodes (LEDs) have attracted much attention due to their
versatility in a variety of applications and growing demand in markets such as general …
versatility in a variety of applications and growing demand in markets such as general …
Current-induced degradation and lifetime prediction of 310 nm ultraviolet light-emitting diodes
The impact of operation current on the degradation behavior of 310 nm UV LEDs is
investigated over 1000 h of stress. It ranges from 50 to 300 mA and corresponds to current …
investigated over 1000 h of stress. It ranges from 50 to 300 mA and corresponds to current …
[HTML][HTML] Lifetime prediction based on Gamma processes from accelerated degradation data
H Wang, T Xu, Q Mi - Chinese Journal of Aeronautics, 2015 - Elsevier
Accelerated degradation test is a useful approach to predict the product lifetime at the
normal use stress level, especially for highly reliable products. Two kinds of the lifetime …
normal use stress level, especially for highly reliable products. Two kinds of the lifetime …
An artificial neural network supported stochastic process for degradation modeling and prediction
D Liu, S Wang - Reliability Engineering & System Safety, 2021 - Elsevier
An artificial neural network supported stochastic process for degradation modeling and
prediction is proposed in this paper. An artificial neural network is applied to describe the …
prediction is proposed in this paper. An artificial neural network is applied to describe the …
Bayesian model averaging based reliability analysis method for monotonic degradation dataset based on inverse Gaussian process and Gamma process
D Liu, S Wang, C Zhang, M Tomovic - Reliability Engineering & System …, 2018 - Elsevier
A Bayesian model averaging based reliability analysis method for monotonic degradation
modeling and inference is proposed in this paper. Considering the model uncertainty, the …
modeling and inference is proposed in this paper. Considering the model uncertainty, the …
Reliability and Degradation Mechanisms of Deep UV AlGaN LEDs
There are numerous applications for deep UV AlGaN Light-Emitting Diodes (LEDs) in virus
inactivation, air and water purification, sterilization, bioagent detection and UV polymer …
inactivation, air and water purification, sterilization, bioagent detection and UV polymer …
Heat-dissipation performance of cylindrical heat sink with perforated fins
G Song, DH Kim, DH Song, JB Sung… - International Journal of …, 2021 - Elsevier
The temperature of light-emitting diode (LED) light bulbs must be managed to maintain their
performance and increase their lifespan, and the design and application of an appropriate …
performance and increase their lifespan, and the design and application of an appropriate …
Model uncertainty in accelerated degradation testing analysis
In accelerated degradation testing (ADT), test data from higher than normal stress conditions
are used to find stochastic models of degradation, eg, Wiener process, Gamma process, and …
are used to find stochastic models of degradation, eg, Wiener process, Gamma process, and …