A short-circuit safe operation area identification criterion for SiC MOSFET power modules

PD Reigosa, F Iannuzzo, H Luo… - IEEE Transactions on …, 2016 - ieeexplore.ieee.org
This paper proposes a new method for the investigation of the short-circuit safe operation
area (SCSOA) of state-of-the-art SiC MOSFET power modules rated at 1.2 kV based on the …

Impact of repetitive short-circuit tests on the normal operation of SiC MOSFETs considering case temperature influence

H Du, PD Reigosa, L Ceccarelli… - IEEE Journal of …, 2019 - ieeexplore.ieee.org
This article presents the impact of repetitive shortcircuit (SC) tests on the normal operation of
a commercial silicon carbide (SiC) MOSFET and the influence of different case temperatures …

Failure estimates for SiC power MOSFETs in space electronics

KF Galloway, AF Witulski, RD Schrimpf, AL Sternberg… - Aerospace, 2018 - mdpi.com
Silicon carbide (SiC) power metal-oxide-semiconductor field effect transistors (MOSFETs)
are space-ready in terms of typical reliability measures. However, single event burnout …

Implications of Ageing Through Power Cycling on the Short-Circuit Robustness of 1.2-kV SiC mosfets

PD Reigosa, H Luo, F Iannuzzo - IEEE Transactions on Power …, 2019 - ieeexplore.ieee.org
In this paper, the reliability performance of 1.2-kV silicon carbide (SiC) power mosfet
modules is investigated through the combination of both accelerated power-cycling tests …

Repetitive short circuit capability of SiC MOSFET at specific low gate-source voltage bias for more robust extreme operation

W Jouha, F Richardeau, S Azzopardi - Microelectronics Reliability, 2021 - Elsevier
This paper presents short-circuit (SC) performance of a commercial silicon-carbide (SiC)
MOSFET device under repetitive SC stress at high drain source voltage. Two protocols are …

Investigation on the short circuit safe operation area of SiC MOSFET power modules

PD Reigosa, H Luo, F Iannuzzo… - 2016 IEEE Energy …, 2016 - ieeexplore.ieee.org
This paper gives a better insight of the short circuit capability of state-of-the-art SiC MOSFET
power modules rated at 1.2 kV by highlighting the physical limits under different operating …

SiC MOSFET 短路失效与退化机理研究综述及展望

康建龙, 辛振, 陈建良, 王怀, 李武华 - 中国电机工程学报, 2020 - epjournal.csee.org.cn
SiC MOSFET 可以大幅提升变流器的效率和功率密度, 在高频, 高温, 高压等领域有较好的应用
前景. 但是, 由于其短路耐受时间短, 特性退化现象严重以及失效机理模糊等因素, 致使SiC …

Comparison of the short circuit capability of planar and trench SiC MOSFETs

D Pappis, L de Menezes… - PCIM Europe 2017; …, 2017 - ieeexplore.ieee.org
An experimental investigation about the short circuit capability of planar and the new trench
SiC MOSFETs is presented, providing a performance comparison between them. 1200 V-40 …

Understanding high temperature static and dynamic characteristics of 1.2 kV SiC power MOSFETs

SY Liu, YF Jiang, WJ Sung, XQ Song… - Materials Science …, 2017 - Trans Tech Publ
High temperature capability of silicon carbide (SiC) power MOSFETs is becoming more
important as power electronics faces wider applications in harsh environments. In this paper …

Steady-state over-current safe operation area (SOA) of the SiC MOSFET at cryogenic and room temperatures

X Chen, S Jiang, Y Chen, B Shen, M Zhang, H Gou… - Cryogenics, 2022 - Elsevier
The over-current withstanding ability of the silicon carbide (SiC) based metal–
oxidesemiconductor field effect transistor (MOSFET) is really important for the survival during …