This article presents the impact of repetitive shortcircuit (SC) tests on the normal operation of a commercial silicon carbide (SiC) MOSFET and the influence of different case temperatures …
Silicon carbide (SiC) power metal-oxide-semiconductor field effect transistors (MOSFETs) are space-ready in terms of typical reliability measures. However, single event burnout …
In this paper, the reliability performance of 1.2-kV silicon carbide (SiC) power mosfet modules is investigated through the combination of both accelerated power-cycling tests …
This paper presents short-circuit (SC) performance of a commercial silicon-carbide (SiC) MOSFET device under repetitive SC stress at high drain source voltage. Two protocols are …
This paper gives a better insight of the short circuit capability of state-of-the-art SiC MOSFET power modules rated at 1.2 kV by highlighting the physical limits under different operating …
D Pappis, L de Menezes… - PCIM Europe 2017; …, 2017 - ieeexplore.ieee.org
An experimental investigation about the short circuit capability of planar and the new trench SiC MOSFETs is presented, providing a performance comparison between them. 1200 V-40 …
High temperature capability of silicon carbide (SiC) power MOSFETs is becoming more important as power electronics faces wider applications in harsh environments. In this paper …
X Chen, S Jiang, Y Chen, B Shen, M Zhang, H Gou… - Cryogenics, 2022 - Elsevier
The over-current withstanding ability of the silicon carbide (SiC) based metal– oxidesemiconductor field effect transistor (MOSFET) is really important for the survival during …