Analysis of electromagnetic interference under different types of near‐field environments

S Jeon, S Park, JH Kwon, D Kim - Electronics letters, 2014 - Wiley Online Library
The effect of different interferences on a victim wireless device in electric and magnetic near‐
field (NF) environments is investigated. Using a four‐port transverse electromagnetic (TEM) …

Study of noise reduction from SMPS in the wireless power transmission system

S Jeon, JH Kwon, BC Kim, JI Moon… - … on Antennas and …, 2016 - ieeexplore.ieee.org
In this paper, the PCB layout changed to reduce the electromagnetic interference noise from
switch mode power supply in the wireless power transmission system. The critical current …

Study of a four-port TEM cell with the statistical approach for the calibration of EM field probe

S Jeon, JH Kwon, D Kim - 2014 IEEE Conference on Antenna …, 2014 - ieeexplore.ieee.org
The transverse electromagnetic (TEM) cells are widely used for field probe calibrations. We
propose the verification of TEM mode with statistical method using a four-port TEM cell. The …

A methodology to generate a time-varying adjustable wave impedance inside a TEM cell

G Li, VAK Prabhala, A Saxena, Q Wang… - 2014 IEEE …, 2014 - ieeexplore.ieee.org
A methodology to generate a time-varying adjustable wave impedances inside a TEM cell is
introduced for electromagnetic susceptibility tests of small electronic modules. The TEM cell …

Method to reduce an unwanted EM field component in a 4‐port TEM cell

S Choi, S Jeon, D Kim, SO Park - Electronics Letters, 2018 - Wiley Online Library
As an alternative standard electromagnetic (EM) field generator, a 4‐port TEM (transverse
EM) cell can be used for an EM compatibility (EMC) emission and immunity test. However …

[HTML][HTML] Study of statistical distribution for four-port TEM cell

S Jeon, JH Kwon - Journal of Multimedia Information System, 2014 - jmis.org
The transverse electromagnetic (TEM) cells are widely used for electromagnetic
compatibility (EMC) testing and field probe calibrations. We propose the verification of TEM …

[引用][C] 4-포트TEM 셀을이용한근역장환경구현

전상봉, 박승근, 김동호 - 대한전자공학회학술대회, 2013 - dbpia.co.kr
We propose a simple but efficient method to genearte near filed environments in a four-port
TEM cell using controlled input signal, which presents both good impedance matching and …