A review of techniques for ageing detection and monitoring on embedded systems
Embedded digital devices are progressively deployed in dependable or safety-critical
systems. These devices undergo significant hardware ageing, particularly in harsh …
systems. These devices undergo significant hardware ageing, particularly in harsh …
CMOS reliability from past to future: A survey of requirements, trends, and prediction methods
Developments in IC fabrication, emerging high-reliability markets, and government
regulations indicate potential for significant shifts in how reliability fits within IC development …
regulations indicate potential for significant shifts in how reliability fits within IC development …
NBTI Effect Survey for Low Power Systems in Ultra-Nanoregime
Background: Electronic device scaling with the advancement of technology nodes maintains
the performance of the logic circuits with area benefit. Metal oxide semiconductor (MOS) …
the performance of the logic circuits with area benefit. Metal oxide semiconductor (MOS) …
Process variation and NBTI resilient Schmitt trigger for stable and reliable circuits
Negative bias temperature instability (NBTI) is a major time-dependent reliability concern
with the pMOS transistor at elevated temperature. NBTI in pMOS is the severe dominating …
with the pMOS transistor at elevated temperature. NBTI in pMOS is the severe dominating …
A survey on impact of transient faults on bnn inference accelerators
N Khoshavi, C Broyles, Y Bi - arXiv preprint arXiv:2004.05915, 2020 - arxiv.org
Over past years, the philosophy for designing the artificial intelligence algorithms has
significantly shifted towards automatically extracting the composable systems from massive …
significantly shifted towards automatically extracting the composable systems from massive …
A near-threshold voltage oriented digital cell library for high-energy efficiency and optimized performance in 65nm CMOS process
J Jun, J Song, C Kim - … Transactions on Circuits and Systems I …, 2017 - ieeexplore.ieee.org
A digital cell library operating in the near-threshold voltage (NTV) region is presented to
obtain both high energy efficiency and optimized performance. The proposed library …
obtain both high energy efficiency and optimized performance. The proposed library …
Design and Simulation for NBTI Aware Logic Gates
Reliability of the electronic circuits is one of the most prominent factor in the development of
very large-scale integration (VLSI) industry. Huge demand for compact size and high …
very large-scale integration (VLSI) industry. Huge demand for compact size and high …
Fundamentals, modeling, and application of magnetic tunnel junctions
Aggressive Metal Oxide Semiconductor (MOS) technology scaling in digital circuits has
resulted in important challenges including a significant increase in leakage currents, short …
resulted in important challenges including a significant increase in leakage currents, short …
Ada-FA: A Comprehensive Framework for Adaptive Fault Tolerance and Ageing Mitigation in FPGAs
Z Li, Y Wang, Z Huang, J Wang… - IEEE Internet of …, 2024 - ieeexplore.ieee.org
Commercial SRAM-based field-programmable gate arrays (FPGAs) are extremely
susceptible to failures caused by external ionizing radiation or prolonged internal …
susceptible to failures caused by external ionizing radiation or prolonged internal …
Compression or corruption? a study on the effects of transient faults on bnn inference accelerators
N Khoshavi, C Broyles, Y Bi - 2020 21st International …, 2020 - ieeexplore.ieee.org
Over past years, the philosophy for designing the artificial intelligence algorithms has
significantly shifted towards automatically extracting the composable systems from massive …
significantly shifted towards automatically extracting the composable systems from massive …