X-ray Testing

D Mery, D Mery - Computer Vision for X-Ray Testing: Imaging, Systems …, 2015 - Springer
X-ray testing has been developed for the inspection of materials or objects, where the aim is
to analyze—nondestructively—those inner parts that are undetectable to the naked eye …

ICAS: an extensible framework for estimating the susceptibility of ic layouts to additive trojans

T Trippel, KG Shin, KB Bush… - 2020 IEEE Symposium on …, 2020 - ieeexplore.ieee.org
The transistors used to construct Integrated Circuits (ICs) continue to shrink. While this
shrinkage improves performance and density, it also reduces trust: the price to build leading …

[图书][B] Computer vision for x-ray testing: Imaging, systems, image databases, and algorithms

D Mery, C Pieringer - 2020 - books.google.com
This accessible textbook presents an introduction to computer vision algorithms for
industrially-relevant applications of X-ray testing. Covering complex topics in an easy-to …

SWAN: mitigating hardware trojans with design ambiguity

T Linscott, P Ehrett, V Bertacco… - 2018 IEEE/ACM …, 2018 - ieeexplore.ieee.org
For the past decade, security experts have warned that malicious engineers could modify
hardware designs to include hardware back-doors (trojans), which, in turn, could grant …

Gate-level validation of integrated circuits with structured-illumination read-out of embedded optical signatures

N Zaraee, B Zhou, K Vigil, MM Shahjamali… - IEEE …, 2020 - ieeexplore.ieee.org
The integrated circuit (IC) chips are essential components in a variety of computing systems
ranging from consumer electronics to high-security military devices. Hence, the authenticity …

T-TER: Defeating A2 Trojans with Targeted Tamper-Evident Routing

T Trippel, KG Shin, KB Bush, M Hicks - … of the 2023 ACM Asia Conference …, 2023 - dl.acm.org
Since the inception of the Integrated Circuit (IC), the size of the transistors used to construct
them has continually shrunk. While this advancement significantly improves computing …

Addressing supply chain risks of microelectronic devices through computer vision

Z Chen, T Wanyan, R Rao, B Cutilli… - 2017 IEEE Applied …, 2017 - ieeexplore.ieee.org
Microelectronics are at the heart of nearly all modern devices, ranging from small embedded
integrated circuits (ICs) inside household products to complex microprocessors that power …

Modeling and model-aware signal processing methods for enhancement of optical systems

A Aksoylar - 2016 - search.proquest.com
Theoretical and numerical modeling of optical systems are increasingly being utilized in a
wide range of areas in physics and engineering for characterizing and improving existing …

An extensible framework for quantifying the coverage of defenses against untrusted foundries

T Trippel, KG Shin, KB Bush, M Hicks - arXiv preprint arXiv:1906.08836, 2019 - arxiv.org
The transistors used to construct Integrated Circuits (ICs) continue to shrink. While this
shrinkage improves performance and density, it also reduces trust: the price to build leading …

Applications in x-ray testing

D Mery, C Pieringer, D Mery, C Pieringer - Computer vision for x-ray testing …, 2021 - Springer
In this chapter, relevant applications on X-ray testing are described. We cover X-ray testing
in (i) castings,(ii) welds,(iii) baggage,(iv) natural products, and (v) others (like cargos and …